Industry News | 2021-06-30 04:21:06.0
Takaya's APT-1600FD-SL Dual Sided Flying Probe test system for assembled PCBAs delivers both high speed and a larger testing area designed to accommodate large PCBAs for the emerging markets of 5G communications and BMS (Battery Management System) applications. The "-SL" series provides a 48% larger test area, which aligns perfectly with applications including semi conductor test probe card manufacturers. These customers urged Takaya to increase the test area of their dual-sided system.
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