New Equipment | Test Equipment
The 8564E portable millimeter spectrum analyzer offers the measurement capability and performance previously found in larger, more expensive benchtop analyzers. You can measure signals from 30 Hz to 40 GHz (preselected above 2.75 GHz) with a single c
Industry Directory | Distributor / Manufacturer
Lorlin manufactures discrete semiconductor component test systems for small signal and power devices. 50 years in business, over 3000 installations. SMD devices: transistors, Fets, diodes, scrs, triacs, optos, and many others.
Technical Library | 2014-11-18 23:59:30.0
Performance degradation of packaging material is an important reason for the lifetime reduction of LED. In order to understanding the failure behavior of packaging material, silicone and phosphor were chosen to fabricate LED samples within which an aging test at 125℃ was performed. The result of online luminance measurement showed that LED samples with both silicone and phosphor had the highest luminance decay rate among all test samples because the carbonization of silicone and the consequent outgassing reduced the luminance quickly. The result of the luminance variance with test time was analyzed and an exponential decay model was developed with which the lifetime of LED under high temperature could be estimated.
Used SMT Equipment | In-Circuit Testers
Aeroflex IFR 2945B-01-06 Aeroflex-IFR 2945B-01-06 with 2 year warranty, NEW OPEN BOX A compact, lightweight and rugged instrument that allows laboratory standard measurements to be conducted in the field. Rugged lightweight package Full s
Technical Library | 2014-08-19 16:07:15.0
Warpage management consists of planning, measuring, analyzing, sharing, and reacting to data related to the surface shapes of electronics components as they change throughout the reflow assembly process. Leading semiconductor manufacturers have had warpage management systems in place for ten years or more, mainly because microchip package warpage must be understood and compensated for in order to attain high assembly yields. Similarly, newer device architectures such as package-on-package and system-on-a-chip are sensitive to warpage-related assembly issues, and companies involved in the manufacture and assembly of these devices tend to have the most advanced warpage management programs.
Used SMT Equipment | In-Circuit Testers
Keysight-Agilent 8563EC-006 Portable Spectrum Analyzer, 9 kHz to 26.5 GHz The Agilent 8563EC portable, color display microwave spectrum analyzer offers the measurement capability and performance previously found in larger, more expensive bencht
Used SMT Equipment | In-Circuit Testers
BitAlyzer Error Performance Analyzer Agilent/HP 86130A Error Performance Analyzer 3.6GB/s This integrated Pattern Generator and Error Detector is designed to quickly solve your design and manufacturing problems. Complementing the 86100A Infiniium
New Equipment | Test Equipment
Agilent/HP DSO9064A Oscilloscope: 600 MHz, 4 Analog Channels Agilent’s Infiniium DSO9064A, equipped with a 15” XGA display, comes in a package that is just 9” (23 cm) deep and weighs only 26 (11.8 kg) pounds to preserve your limited bench space. Th
Industry Directory | Manufacturer
Buyers of Scrap Materials and Surplus Machinery, Equipment and Inventories Precious Metal Refining Warehouse Liquidation PCB & Electronic Scrap Recycling Purchasing of Used Surplus Semiconductor
winsouce.jpg)