Electronics Forum: soldermask causing cracks in traces (8)

Via Failure in Field

Electronics Forum | Wed Jan 06 09:38:59 EST 2010 | lynn_norman

Via failure could be caused by cracks in the barrel, or thin plating, or fractures in the traces leading to the vias, . X-ray analysis could pick up a fractured trace and cross-sectioning of the vias could pick up the cracks and thin plating. Secon

ROI on AOI Machines

Electronics Forum | Mon Jul 07 21:08:17 EDT 2003 | sam

I have an experience about AOI that it is necessary in a complicated PCB. Due to the final circuit design, the concerned PCB were having nets on the boards, that the Open/Short could not be identified by traditional In-Circuit testers. Some long tr

Industry News: soldermask causing cracks in traces (1)

Why use Via in Pad Design?

Industry News | 2019-11-05 22:08:21.0

Via in pad is the design practice of placing a via in the copper landing pad of a component. Compared to standard PCB via routing, via in pad allows a design to use smaller component pitch sizes and further reduce the PCBs overall size. With component manufactures pushing smaller parts every year and the demand from consumers for smaller devices, the usage of via in pad practices by hardware engineers have become more commonplace. In this article, we will discuss the differences between via in pad and traditional vias, when should you use via in pad, and how to design for it.

Headpcb

Technical Library: soldermask causing cracks in traces (1)

How Clean is Clean Enough – At What Level Does Each of The Individual Contaminates Cause Leakage and Corrosion Failures in SIR?

Technical Library | 2016-09-08 16:27:49.0

In this investigation a test matrix was completed utilizing 900 electrodes (small circuit board with parallel copper traces on FR-4 with LPI soldermask at 6, 10 and 50 mil spacing): 12 ionic contaminants were applied in five concentrations to three different spaced electrodes with five replicas each (three different bare copper trace spacing / five replications of each with five levels of ionic concentration). The investigation was to assess the electrical response under controlled heat and humidity conditions of the known applied contamination to electrodes, using the IPC SIR (surface insulation resistance) J-STD 001 limits and determine at what level of contamination and spacing the ionic / organic residue has a failing effect on SIR.

Foresite Inc.

Express Newsletter: soldermask causing cracks in traces (316)

SMTnet Express - Septemeber 8, 2016

SMTnet Express, Septemeber 8, 2016, Subscribers: 26,370, Companies: 14,943, Users: 41,052 How Clean is Clean Enough – At What Level Does Each of The Individual Contaminates Cause Leakage and Corrosion Failures in SIR? Terry Munson, Paco Solis


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