Signal Display Systems is a manufacturer and contracting company that is currently marketing an inexpensive OTDR device, an arbitrary waveform generator, and several next-generation display devices.
Industry Directory | Equipment Dealer / Broker / Auctions
BRL Test is a full service electronic test equipment dealer. Low prices on premium quality equipment is what we are about. Our world class repair lab is what sets us apart. http://www.brltest.com/
Hanwha DECAN F2 Pick and Place Machine High Speed:120,000 CPH Ultra Slim Design with a Total Length of 1.25m Applies High Rotary Modular Head Side-view Vision System Product description: Hanwha DECAN F2 Pick and Place Machine High Speed SMT Modular
New Equipment | Test Equipment
1. Support HDM1 1.3 / 1.4 2. 4 HDMI output port, one HDMI input 3. Each port supports HDCP KEY and EDID functionality testing, test results superimposed on the image of the channel output 4. Built-in variety pattern selection and different frequen
Electronics Forum | Wed Aug 16 03:17:51 EDT 2017 | khazzam01
Can any one tell me what to do , we install a new X-ray generator(YXLON) as a replacement but upon testing we encountered "undervoltage primary" error. Please tell me what to do?
Electronics Forum | Wed Aug 16 12:57:14 EDT 2017 | dleeper
I would contact the manufacturer of your machine. X-Ray equipment isn't something you want to fool with if you don't know what your doing.
Used SMT Equipment | In-Circuit Testers
Fealures • Modular upgrade options from MDA to ICT and functional test • High fault coverage test solution • Limited access solution and functional test expansion using PXI modules • Friendly UI with fast and easy program development Tester Sp
Used SMT Equipment | General Purpose Test & Measurement
Description The Agilent 33250A is our highest performance function generator. With 11 standard waveforms plus pulse and arbitrary waveforms - it is the most frequency stable and lowest distortion function generator in its class Key Features & Spec
Industry News | 2012-04-06 15:32:39.0
GPD Global, a manufacturer of precision fluid dispensing systems for high-volume 24/7, low-volume/high-mix and R&D production, announces the global release of its PCD4 Dispense Pump after its successful release and testing in the North American market.
Industry News | 2003-05-06 09:05:12.0
New Schematic Capture and Simulation Software Delivers Innovative Features and the Industry�s Best Price/Performance
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Parts & Supplies | Pick and Place/Feeders
FUJI NXT feeder I generation and second generation feeder We provide FUJI NXT feeder I generation and second generation. 1）NXT I Feeder UF07700 W8 REEL CASE TYPE REEL HOLDER UF01400 W12 INTELLIGNET Feeder W/OUT REEL HOLDER UF01500 W16 INTELLIGN
Parts & Supplies | Pick and Place/Feeders
We provide FUJI NXT feeder I generation and second generation. 1)NXT I Feeder UF07700 W8 REEL CASE TYPE REEL HOLDER UF01400 W12 INTELLIGNET Feeder W/OUT REEL HOLDER UF01500 W16 INTELLIGNET Feeder W/OUT REEL HOLDER UF00800 W16 INTELLIGENT Feeder
Technical Library | 2020-07-08 20:05:59.0
There is a compelling need for functional testing of high-speed input/output signals on circuit boards ranging from 1 gigabit per second (Gbps) to several hundred Gbps. While manufacturing tests such as Automatic Optical Inspection (AOI) and In-Circuit Test (ICT) are useful in identifying catastrophic defects, most high-speed signals require more scrutiny for failure modes that arise due to high-speed conditions, such as jitter. Functional ATE is seldom fast enough to measure high-speed signals and interpret results automatically. Additionally, to measure these adverse effects it is necessary to have the tester connections very close to the unit under test (UUT) as lead wires connecting the instruments can distort the signal. The solution we describe here involves the use of a field programmable gate array (FPGA) to implement the test instrument called a synthetic instrument (SI). SIs can be designed using VHDL or Verilog descriptions and "synthesized" into an FPGA. A variety of general-purpose instruments, such as signal generators, voltmeters, waveform analyzers can thus be synthesized, but the FPGA approach need not be limited to instruments with traditional instrument equivalents. Rather, more complex and peculiar test functions that pertain to high-speed I/O applications, such as bit error rate tests, SerDes tests, even USB 3.0 (running at 5 Gbps) protocol tests can be programmed and synthesized within an FPGA. By using specific-purpose test mechanisms for high-speed I/O the test engineer can reduce test development time. The synthetic instruments as well as the tests themselves can find applications in several UUTs. In some cases, the same test can be reused without any alteration. For example, a USB 3.0 bus is ubiquitous, and a test aimed at fault detection and diagnoses can be used as part of the test of any UUT that uses this bus. Additionally, parts of the test set may be reused for testing another high-speed I/O. It is reasonable to utilize some of the test routines used in a USB 3.0 test, in the development of a USB 3.1 (running at 10 Gbps), even if the latter has substantial differences in protocol. Many of the SI developed for one protocol can be reused as is, while other SIs may need to undergo modifications before reuse. The modifications will likely take less time and effort than starting from scratch. This paper illustrates an example of high-speed I/O testing, generalizes failure modes that are likely to occur in high-speed I/O, and offers a strategy for testing them with SIs within FPGAs. This strategy offers several advantages besides reusability, including tester proximity to the UUT, test modularization, standardization approaching an ATE-agnostic test development process, overcoming physical limitations of general-purpose test instruments, and utilization of specific-purpose test instruments. Additionally, test instrument obsolescence can be overcome by upgrading to ever-faster and larger FPGAs without losing any previously developed design effort. With SIs and tests scalable and upward compatible, the test engineer need not start test development for high-speed I/O from scratch, which will substantially reduce time and effort.
Technical Library | 1999-05-06 14:03:04.0
This paper describes how Nikes innovative architecture addresses the expanding requirements of Intels next-generation processor designs while enabling a design environment that is more productive than one built with the previous tool generation.
Training Courses | | | PCB Design Courses
The PCB design courses teach students the process, techniques and tools needed to design layout of printed circuit boards.
Training Courses | | | PCB Design Courses
The PCB design courses teach students the process, techniques and tools needed to design layout of printed circuit boards.
Events Calendar | Thu Sep 27 00:00:00 EDT 2018 - Fri Sep 28 00:00:00 EDT 2018 | Lyon, France
IPC/WHMA Cable and Wire Harness Assemblies Conference
Events Calendar | Thu Jun 08 00:00:00 EDT 2023 - Thu Jun 08 00:00:00 EDT 2023 | ,
SMTA Workforce Development Webinar: PCB Design Courses and Careers in PCB Design
Career Center | Fremont, California USA | Engineering
Define validation test plan for SSD’s and other Flash products. Implement a test plan strategy and to develop test methodologies to cover product specification for SSD’s and other Flash products. Assist in selection of test hardware and writi
Career Center | Fremont, California USA | Engineering
Ensure manufacturing have calibration and preventive maintenance processes in place to ensure the integrity of test equipment used on our products. Lead and responsible for all aspects of the RMA/GRS processes from initial analysis, board debug t
Career Center | BANGALORE, India | Engineering,Maintenance,Production
Hi, I have 8 years experience in electronics manufacturing company. I have good knowledge in SMT process and equipment maintenance.i successfully completed more than 200 NPI's. I have good knowledge in SMT machine programming and maintenance
Career Center | Grand Rapids, Michigan USA | Engineering,Maintenance,Management,Production,Research and Development,Technical Support
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QYSMT SOLUTION USA LLC / Qinyi Electronics Co.,Ltd | https://www.qy-smt.com/shop/h1007d-generator-vacuum-181677?page=47
GENERATOR,VACUUM H1007D /shop/h1007d-generator-vacuum-181677 ¥ 0.00 0.0 CNY ¥ 0.00 ¥ 0.00 This combination does not exist. ADD TO CART Inquiry Now > 1.Quality and
ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/adhesive-dispensing-systems/products/applicators/ecobead-pattern-generator
™ Pattern Generator Economical and easy to use, the EcoBead pattern generator lets you apply short, intermittent beads in place of long continuous beads by enabling your parent machine controls
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