Partner Websites: ball attach process 90/10 (Page 1 of 12)

520 Pressure Curing Oven (PCO)

Heller Industries Inc. | https://hellerindustries.com/curing-oven/

: Process time: Generally 120 min or User’s spec Operating temp: 60oC ~ 200oC Maximum temp: 220oC Operating pressure: 1 bar – 10 bar Capacity: 24 Magazines (typical) Cooling method: PCW (17oC – 23oC) Cooling water pressure

Heller Industries Inc.

Cold Bump Pull | Nordson DAGE

ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/dage/test-types/cold-bump-pull?con=t&page=4

. The cold bump pull test method is required as traditional shear testing tends to deform the solder ball during the test such that the area of attach can become damaged during the process

ASYMTEK Products | Nordson Electronics Solutions

EP2S180F1508I4 - Altera - Free Library Parts

PCB Libraries, Inc. | https://www.pcblibraries.com/POD/Default.asp?M=ALTERA&PN=EP2S180F1508I4

:      IC, Stratix II, 1.2-V, 90-nm, All-Layer Copper SRAM Process Physical Description:      Ball Grid Array (BGA), 1.00 mm pitch, square; 1508 pin, 40.00 mm L X 40.00 mm W X 3.50 mm H body Manufacturer

PCB Libraries, Inc.

EP2S90F1508C4 - Altera - Free Library Parts

PCB Libraries, Inc. | https://www.pcblibraries.com/POD/Default.asp?M=ALTERA&PN=EP2S90F1508C4

:      IC, Stratix II, 1.2-V, 90-nm, All-Layer Copper SRAM Process Physical Description:      Ball Grid Array (BGA), 1.00 mm pitch, square; 1508 pin, 40.00 mm L X 40.00 mm W X 3.50 mm H body Manufacturer

PCB Libraries, Inc.

EP2S180F1508C3 - Altera - Free Library Parts

PCB Libraries, Inc. | https://www.pcblibraries.com/POD/Default.asp?M=ALTERA&PN=EP2S180F1508C3

:      IC, Stratix II, 1.2-V, 90-nm, All-Layer Copper SRAM Process Physical Description:      Ball Grid Array (BGA), 1.00 mm pitch, square; 1508 pin, 40.00 mm L X 40.00 mm W X 3.50 mm H body Manufacturer

PCB Libraries, Inc.

EP2S180F1508C4 - Altera - Free Library Parts

PCB Libraries, Inc. | https://www.pcblibraries.com/POD/Default.asp?M=ALTERA&PN=EP2S180F1508C4

:      IC, Stratix II, 1.2-V, 90-nm, All-Layer Copper SRAM Process Physical Description:      Ball Grid Array (BGA), 1.00 mm pitch, square; 1508 pin, 40.00 mm L X 40.00 mm W X 3.50 mm H body Manufacturer

PCB Libraries, Inc.

EP2S180F1508C5 - Altera - Free Library Parts

PCB Libraries, Inc. | https://www.pcblibraries.com/POD/Default.asp?M=ALTERA&PN=EP2S180F1508C5

:      IC, Stratix II, 1.2-V, 90-nm, All-Layer Copper SRAM Process Physical Description:      Ball Grid Array (BGA), 1.00 mm pitch, square; 1508 pin, 40.00 mm L X 40.00 mm W X 3.50 mm H body Manufacturer

PCB Libraries, Inc.

EP2S90F1508C5 - Altera - Free Library Parts

PCB Libraries, Inc. | https://www.pcblibraries.com/POD/Default.asp?M=ALTERA&PN=EP2S90F1508C5

:      IC, Stratix II, 1.2-V, 90-nm, All-Layer Copper SRAM Process Physical Description:      Ball Grid Array (BGA), 1.00 mm pitch, square; 1508 pin, 40.00 mm L X 40.00 mm W X 3.50 mm H body Manufacturer

PCB Libraries, Inc.

EP2S90F1508I4 - Altera - Free Library Parts

PCB Libraries, Inc. | https://www.pcblibraries.com/POD/Default.asp?M=ALTERA&PN=EP2S90F1508I4

:      IC, Stratix II, 1.2-V, 90-nm, All-Layer Copper SRAM Process Physical Description:      Ball Grid Array (BGA), 1.00 mm pitch, square; 1508 pin, 40.00 mm L X 40.00 mm W X 3.50 mm H body Manufacturer

PCB Libraries, Inc.

Cold Bump Pull | Nordson DAGE

ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/dage/test-types/cold-bump-pull?con=t&page=9

. The cold bump pull test method is required as traditional shear testing tends to deform the solder ball during the test such that the area of attach can become damaged during the process

ASYMTEK Products | Nordson Electronics Solutions

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