Technical Library: operating (Page 4 of 15)

Achieving Large Scale Parallelism Through Operating System Resource Management on the Intel TFLOPS Supercomputer

Technical Library | 1999-05-07 09:58:23.0

From the point of view of an operating system, a computer is managed and optimized in terms of the application programming model and the management of system resources. For the TFLOPS system, the problem is to manage and optimize large scale parallelism. This paper looks at the management in terms of three key topics: memory management, communication, and input/output.

Intel Corporation

Dust removal in temperature and humidity Test Chamber (2/2)

Technical Library | 2019-05-21 00:21:26.0

Continue to talk about the dust removal from temperature humidity test chamber. Cleaning and maintenance: 1) Pls remove internal impurities inisde chamber before operation. 2) The power distribution room should be cleaned at least once a year, and the dust can be removed by vacuum cleaner. 3) The exterior chamber must also be cleaned more than once a year, which can be wiped with soapy water. Inspection and maintenance of humidifier: The water storage in humidifier should be replaced once a month to ensure clean water quality, humidifying water tray should be cleaned once a month to ensure smooth flow of water. The inspection of over-temperature protector:during the test: If the temperature is over 20 ℃ ~ 30 ℃ than the maximum value setted,the power supply of the heater will stop, the "OVERHEAT" overt-emperature warning light will automatically turn on but the fan is still in operation, if the equipment runs without operator around,the operator should check the over-temperature protector in advance to ensure wether it has been setted properly before start [wet ball over-temperature protector set to 120 ℃].

Symor Instrument Equipment Co.,Ltd

Miniaturization of Cooling Solutions

Technical Library | 1999-05-06 11:52:21.0

The market's demand for increasingly powerful products, in smaller and smaller packaging, creates a cooling problem. Integrated circuit (IC) lifetime is dependent upon its operating temperature, creating a trade-off situation: either you enlarge the package to accept additional cooling, or you sacrifice IC lifetime.

Aavid Thermalloy, LLC

Intel StrataFlash™ Memory Development and Implementation

Technical Library | 1999-05-07 10:13:38.0

This paper will review the device physics governing the operation of the industry standard ETOX™ flash memory cell and show how it is ideally suited for multiple bit per cell storage, through its storage of electrons on an electrically isolated floating gate and through its direct access to the memory cell.

Intel Corporation

The Basics of Soldering

Technical Library | 2009-12-14 20:31:18.0

In this article, I will present a basic overview of soldering for those who are new to the world of soldering and for those who could use a refresher. I will discuss the definition of soldering, the basics of metallurgy, how to choose the proper alloy, the purpose of a flux, soldering temperatures, and typical heating sources for soldering operations.

Indium Corporation

Using JTAG Emulation for Board-Level Functional Test Demanding Test

Technical Library | 2010-09-02 13:13:03.0

As chip packaging and interconnectivity have become more dense and operate at higher clock frequencies, physical access for traditional bed-of-nails testing becomes limited. This results in loss of ICT (in-circuit test) fault coverage and higher test fi

Corelis Inc

BTC and SMT Rework Challenges

Technical Library | 2019-05-22 21:24:05.0

voidless treatment Smaller components -> miniaturization (01005 capability) Large board handling -> dynamic preheating for large board repair Repeatable processes -> flux and paste application (Dip and Print), residual solder removal (scavenging), dispensing, multiple component handling, and traceability Operator support -> higher automation, software guidance

kurtz ersa Corporation

Strategies To Mitigate The Tin Whisker Phenomenon

Technical Library | 2023-02-13 19:04:25.0

The tin whisker phenomenon is a failure mode associated with all electronic devices that use a number of low melting point elements (e.g., Sn, Cd, In) in operations such as soldering. Recognized many years ago, the problem was minimized by adding lead, now identified as a hazardous substance and banned

Vicor Corporation

Why Signal Always Be Loss in a High Speed, High Frequency Transmission Line

Technical Library | 2014-02-13 16:46:23.0

The high speed transmission applications in the electronic product become inevitable developing trend. The signal integrity becomes the most important issue in the electronics industry. The material suppliers, PCB manufacturers, OEM designers commonly face the serious issue "how to keep signal integrity operated in the high speed transmission" for the modern electronic application nowadays

Elite Material Co., Ltd.

1 Liter of Gap Filler in Only 13 Seconds - New Dispensing Solution for the Thermal Management for HV Batteries

Technical Library | 2018-06-18 13:43:56.0

Thermal influences can significantly compromise the service life, capacity and especially the operational safety of HV batteries. In order to prevent damage due to excessive temperatures, large quantities of heat-conducting potting media are used here. Scheugenpflug has developed a new system solution for fast and reliable application of these materials.

Scheugenpflug Inc.


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