Technical Library: over speed error (Page 1 of 2)

High Speed IC Chip Programming Machine

Technical Library | 2023-11-25 07:46:13.0

In the dynamic realm of Surface Mount Technology (SMT), where efficiency and precision are paramount, I.C.T, a renowned SMT equipment manufacturer, proudly unveils its latest innovation – the I.C.T-910 Automatic IC Programming System. Crafted to cater to the intricate demands of SMD chip programming, this cutting-edge device vows to redefine your programming experience and elevate production capabilities. Programming system.png The Power of IC Programming System: As a beacon of excellence in IC Programming Systems, the I.C.T-910 seamlessly integrates advanced technology with user-friendly features. This system empowers manufacturers in the SMT industry, offering versatility in programming needs by accommodating a wide range of SMD chips. Precision Programming: The I.C.T-910 boasts unparalleled precision in programming SMD chips, ensuring accuracy in every generated code. In the SMT industry, where even the slightest error can lead to setbacks, this precision is indispensable. Efficiency Redefined: Accelerate your production timelines with the I.C.T-910's efficient programming capabilities. Engineered to optimize workflows, this system ensures rapid programming without compromising quality, recognizing that time is money in the SMT industry. User-Friendly Interface: Navigating the complexities of IC programming is simplified with the I.C.T-910's intuitive user interface. Operators, even without extensive programming expertise, can harness the system's power, minimizing the learning curve and maximizing productivity. Compatibility and Adaptability: The I.C.T-910 breaks free from limitations, supporting a wide array of SMD chip models. It is a versatile solution for diverse programming requirements, allowing you to stay ahead of technological advancements. Why Choose I.C.T-910 IC Programming System? 8 sets of 32-64sit burners Nozzle: 4pcs Camera: 2pcs (Component camera + Marking camera) UPH: 2000-3000PCS/H Package type: PLCC, JLCC, SOIC, QFP, TQFP, PQFP, VQFP, TSOP, SOP, TSOPII, PSOP, TSSOP, SON, EBGA, FBGA, VFBGA, BGA, CSP, SCSP, and so on. Compatibility: Adapters provided based on customer products. Simple operation interface: Modular and layered interface with pictures and texts for easy operation. System upgrade: Free software upgrade service. Reliability: Trust in the I.C.T-910, a programming system that prioritizes reliability. Rigorous testing ensures consistent and dependable performance, reducing the risk of programming errors and downtime. Elevate Your Competitiveness: Incorporate the I.C.T-910 into your production line to elevate competitiveness in the market. Stay ahead with a programming system designed to meet the demands of the fast-paced SMT industry. Embrace the Future with I.C.T-910: In a landscape where precision, efficiency, and adaptability are non-negotiable, the I.C.T-910 Automatic IC Programming System emerges as the game-changer for SMT manufacturers. Revolutionize your programming processes, enhance productivity, and future-proof your operations with the I.C.T-910. Choose I.C.T-910 and stay ahead in the SMT industry, ushering in the next era of IC programming excellence.

I.C.T ( Dongguan ICT Technology Co., Ltd. )

Conductive Adhesive Dispensing, Process Considerations

Technical Library | 1999-08-27 09:24:56.0

Dispensing conductive adhesives in an automated factory environment creates some special challenges. A robust production process starts with understanding the adhesives in their fluid state and which important parameters must be controlled. Developing this understanding requires experience with a large number of materials and valves over time. Common uses of conductive adhesives in surface mount applications, die attach applications, and gasketing are addressed. As vendors of dispensing equipment, the authors see a constant stream of such applications. Dispensing requirements, techniques, and equipment resulting from this experience are discussed. Guidelines for optimizing quality and speed are given.

ASYMTEK Products | Nordson Electronics Solutions

Pushing the barriers of wafer level device integration: High-speed assembly, the case for MicroTape.

Technical Library | 2009-01-21 23:01:49.0

Over the last 10 years, the adoption of wafer-level packaging (WLP) has expanded to a wide range of semiconductor devices applied in a crosssection of industries from Automotive to Mobile Phone, Sensors to Medical Technology.

Siemens Process Industries and Drives

Keeping Tin Solderable

Technical Library | 1999-05-06 15:31:13.0

Tin plating on a component lead makes its soldering easier. Everybody knows that. Not so well known is that tin plating has shelf life -- its ability to be easily soldered degrades over time. the speed and severity of degradation depends both on storage conditions and on the plating itself...

TE Connectivity

Making Sense of Laminate Dielectric Properties

Technical Library | 2020-12-16 18:50:42.0

System operating speeds continue to increase as a function of the consumer demand for such technologies as faster Internet connectivity, video on demand, and mobile communications technology. As a result, new high performance PCB substrates have emerged to address signal integrity issues at higher operating frequencies. These are commonly called low Dk and/or low loss (Df) materials. The published "typical" values found on a product data sheet provide limited information, usually a single construction and resin content, and are derived from a wide range of test methods and test sample configurations. A printed circuit board designer or front end application engineer must be aware that making a design decision based on the limited information found on a product data sheet can lead to errors which can delay a product launch or increase the assembled PCB cost. The purpose of this paper is to highlight critical selection factors that go beyond a typical product data sheet and explain how these factors must be considered when selecting materials for high speed applications

Isola Group

Creating Reusable Manufacturing Tests for High-Speed I/O with Synthetic Instruments

Technical Library | 2020-07-08 20:05:59.0

There is a compelling need for functional testing of high-speed input/output signals on circuit boards ranging from 1 gigabit per second (Gbps) to several hundred Gbps. While manufacturing tests such as Automatic Optical Inspection (AOI) and In-Circuit Test (ICT) are useful in identifying catastrophic defects, most high-speed signals require more scrutiny for failure modes that arise due to high-speed conditions, such as jitter. Functional ATE is seldom fast enough to measure high-speed signals and interpret results automatically. Additionally, to measure these adverse effects it is necessary to have the tester connections very close to the unit under test (UUT) as lead wires connecting the instruments can distort the signal. The solution we describe here involves the use of a field programmable gate array (FPGA) to implement the test instrument called a synthetic instrument (SI). SIs can be designed using VHDL or Verilog descriptions and "synthesized" into an FPGA. A variety of general-purpose instruments, such as signal generators, voltmeters, waveform analyzers can thus be synthesized, but the FPGA approach need not be limited to instruments with traditional instrument equivalents. Rather, more complex and peculiar test functions that pertain to high-speed I/O applications, such as bit error rate tests, SerDes tests, even USB 3.0 (running at 5 Gbps) protocol tests can be programmed and synthesized within an FPGA. By using specific-purpose test mechanisms for high-speed I/O the test engineer can reduce test development time. The synthetic instruments as well as the tests themselves can find applications in several UUTs. In some cases, the same test can be reused without any alteration. For example, a USB 3.0 bus is ubiquitous, and a test aimed at fault detection and diagnoses can be used as part of the test of any UUT that uses this bus. Additionally, parts of the test set may be reused for testing another high-speed I/O. It is reasonable to utilize some of the test routines used in a USB 3.0 test, in the development of a USB 3.1 (running at 10 Gbps), even if the latter has substantial differences in protocol. Many of the SI developed for one protocol can be reused as is, while other SIs may need to undergo modifications before reuse. The modifications will likely take less time and effort than starting from scratch. This paper illustrates an example of high-speed I/O testing, generalizes failure modes that are likely to occur in high-speed I/O, and offers a strategy for testing them with SIs within FPGAs. This strategy offers several advantages besides reusability, including tester proximity to the UUT, test modularization, standardization approaching an ATE-agnostic test development process, overcoming physical limitations of general-purpose test instruments, and utilization of specific-purpose test instruments. Additionally, test instrument obsolescence can be overcome by upgrading to ever-faster and larger FPGAs without losing any previously developed design effort. With SIs and tests scalable and upward compatible, the test engineer need not start test development for high-speed I/O from scratch, which will substantially reduce time and effort.

A.T.E. Solutions, Inc.

Issues and Challenges of Testing Modern Low Voltage Devices with Conventional In-Circuit Testers

Technical Library | 2012-12-14 14:25:37.0

The popularity of low voltage technologies has grown significantly over the last decade as semiconductor device manufacturers have moved to satisfy market demands for more powerful products, smaller packaging, and longer battery life. By shrinking the size of the features they etch into semiconductor dice, IC manufacturers achieve lower costs, while improving speed and building in more functionality. However, this move toward smaller features has lead to lower breakdown voltages and increased opportunities for component overstress and false failures during in-circuit test.

Teradyne

NON-CONTACT FLUID DISPENSING WITH PS-8200 JETTING VALVE

Technical Library | 2015-08-18 18:39:13.0

Jetting Valve Technology Superior to Needle Dispensing Compared to traditional needle dispensing technology, jetting valve technology is the most effective method for quick and accurate fluid dispensing. Injection technology has many advantages, it provides a combination of high-speed, high quality and low cost production for fluid dispensing processes. Instead of putting focus on getting the application done, jet dispense technology focuses on performance, providing applications like underfill, potting and encapsulation with more precision than ever before. Improved Fluid Dispensing Speed and Accuracy Non-contact jetting valves offer a significant advantage over traditional needle dispense valves. Jetting Valve Dispenser precision reaches to 200µm with dot diameter or line width as small as 250µm and volumetric dispensing down to .0036µl. Minimum space between lines is 180µm and maximum fluid dispense speed is 200 dots/second. The following video illustrates quick, accurate fluid dispensing for an LED packaging application.

ETS - Energy Technology Systems, Inc.

Printed Circuit Board Assembly & Choosing a Vendor

Technical Library | 2019-10-24 06:29:59.0

Making your novel electronic item design ready for mass fabrication and printed circuit board assembly consists of a lot of steps as well as risks. I will provide a few recommendations about how to neglect pricey errors and how to reduce the time to promote your novel item designs. You can hire printed circuit board assembly services for this. As soon as you have accomplished your product as well as printed circuit board design, you wish to get started developing prototypes prior to you commit to big fabrication volume. A lot of design software packages, for instance, PCB layout design software, as well as an industrial design software program, possess simulation potentials incorporated. Carrying out a simulation facilitates curtailing numerous design mistakes prior to the first prototype is developed. In case you are developing an intrusive item, you might desire to think about a modular design wherein all of the chief functionalities are situated in individual modules. All through your testing, you could then swap modules that don’t cater to the design limits. Spinning individual modules would be swifter and more cost-effective in comparison to spinning a complete design. Counting on the design intricacy, you can mull over manually mounting printed circuit board elements to bank dollars. Nonetheless, for medium to big intricacy this procedure likely to be very time taking, typically in case you wish to create numerous prototypes. Hence it makes sense thinking about a contract manufacturer for the assembly. Whilst running miniature quantity fabrication runs, the fabrication setup expenditure will usually control the by and large prototype constructs expenditure. Whilst seeking a subcontractor, it is finest to choose a vendor that focuses on prototype builds to reduce the cost. Prototype printed circuit board fabricators characteristically join the circuit boards of a number of clients which efficiently shares the setup expenditure in the midst of some customers. The disadvantage is that you would characteristically only be able to want among numerous standard printed circuit board material thicknesses as well as sizes. Apart from choosing a supplier with low setup expenditure, choosing a firm that would moreover be capable to manage your whole fabrication runs curtails mistakes because switching fabricators have the chance of errors owing to a specific supplier interpreting fabrication design data in a different way. This manner your design is already translated into the particular machine data that implies little or no setup expenditure for your final fabrication. A few PCB manufacturers also provide printed circuit board design services that are awesome plus if you do not possess experience with the design. Moreover, these vendors would be capable to help you in case there are issues with your design folders and be capable to detect issues prior to the fabrication.

Optima Technology Associates, Inc.

Implementing Robust Bead Probe Test Processes into Standard Pb-Free Assembly

Technical Library | 2015-08-20 15:18:38.0

Increasing system integration and component densities continue to significantly reduce the opportunity to access nets using standard test points. Over time the size of test points has been drastically reduced (as small as 0.5 mm in diameter) but current product design parameters have created space and access limitations that remove even the option for these test points. Many high speed signal lines have now been restricted to inner layers only. Where surface traces are still available for access, bead probe technology is an option that reduces test point space requirements as well as their effects on high speed nets and distributes mechanical loading away from BGA footprints enabling test access and reducing the risk of mechanical defects associated with the concentration of ICT spring forces under BGA devices. Building on Celestica's previous work characterizing contact resistance associated with Pr-free compatible surface finishes and process chemistry; this paper will describe experimentation to define a robust process window for the implementation of bead probe and similar bump technology that is compatible with standard Pb-free assembly processes. Test Vehicle assembly process, test methods and "Design of Experiments" will be described. Bead Probe formation and deformation under use will also be presented along with selected results.

Celestica Corporation

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