Industry News: sample aoi buy-off report (Page 1 of 1)

IPC Releases Annual Electronics Industry Quality Benchmark Study

Industry News | 2015-09-02 12:17:28.0

IPC Study of Quality Benchmarks for Electronics Assembly 2015 is now available from IPC. The annual study provides data to electronics assembly companies interested in comparing their quality measurements to those of other assembly companies by company size, region and type of product.

Association Connecting Electronics Industries (IPC)

IPC News: IPC Releases Annual Electronics Assembly Quality Benchmark Study

Industry News | 2014-07-24 21:00:30.0

IPC Study of Quality Benchmarks for the Electronics Manufacturing Services (EMS) Industry for 2014 is now available. The annual study provides data to electronics assembly companies interested in comparing their key 2013 quality metrics to those of other assembly companies by company size, region and type of product.

Association Connecting Electronics Industries (IPC)

Yestech Europe features new high speed Automated Optical Inspection solution at SMT Hybrid Packaging, Nuremberg

Industry News | 2012-05-29 12:57:35.0

Yestech Europe launched the Nordson YESTECH new, high-speed FX SL advanced Automated Optical Inspection (AOI) system into Europe at the SMD Hybrid Packaging 2012 exhibition.

Nordson YESTECH

CONSIDER MACHINE VISION FOR SURFACE MEASUREMENT OBSOLETE

Industry News | 2011-06-14 14:37:55.0

The white light axial chromatism technique utilized by Nanovea’s 3D Non Contact Profilometers has become widely known as a vital bench top research and verification tool. It is now the Automated Optical Inspection (AOI) environments that have begun to acknowledge Nanovea’s superior capability. Unlike the traditional vision and laser systems that typically sacrifice one feature for another, speed or resolution, Nanovea provides both. Vision and laser systems also have very limited automated surface measurement options, where as Nanovea’s system provides a wide range including: Profile, Dimension, Roughness, Shape & Form, Flatness & Planarity, Volume Area, Step-Height Depth and Thickness. And keep in mind, the technique utilized by Nanovea’s inspection system has the superior ability to measure nearly any material surface and zero influence from sample reflectivity or absorption.

NANOVEA

Viscom smart 3D AXI at Nepcon’s Dream Factory Demo-Line

Industry News | 2018-08-26 20:13:52.0

Nepcon South China, booth no. 1E45 At the upcoming Nepcon South China show, Viscom will present their advanced 3D AXI inspection technology as part of the show’s smart manufacturing showcase, the “Dream Factory Demo-line”. Viscom also partnered with the IPC Connected Factory Exchange (CFX) initiative to demonstrate a real live industry 4.0 application on their powerful range of 3D AOI, 3D MXI and 3D AXI systems at their booth no. 1E45.

Viscom AG

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