SMTnet Express, September 24, 2015, Subscribers: 23,507, Members: Companies: 14,658, Users: 39,014 Gold Stud Bump Flip Chip Bonding on Molded Interconnect Devices Dick Pang, Weifeng Liu, Anwar Mohammed, Elissa Mckay, Teresita Villavert and Murad
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SMTnet Express, January 28, 2015, Subscribers: 22,279, Members: Companies: 14,195 , Users: 37,607 BVA: Molded Cu Wire Contact Solution for Very High Density Package-on-Package (PoP) Applications Vern Solberg, Ilyas Mohammed - Invensas Corporation
SMTnet Express, February 5, 2015, Subscribers: 22,336, Members: Companies: 14,212 , Users: 37,659 An Alternative Solvent with Low Global Warming Potential R. Basu and R. Hulse - Honeywell International In the past 20 yrs the solvent industry has
SMTnet Express, February 12, 2015, Subscribers: 22,336, Members: Companies: 14,215, Users: 37,692 Evaluating the Mechanical Reliability of Ball Grid Array (BGA) Flexible Surface-Mount Electronics Packaging under Isothermal Ageing Sabuj Mallik
SMTnet Express, February 19, 2015, Subscribers: 22,404, Members: Companies: 14,224, Users: 37,735 Numerical Study on New Pin Pull Test for Pad Cratering Of PCB Billy Hu, Jesus Tan - Flextronics Pad cratering is an important failure mode besides
SMTnet Express, March 5, 2015, Subscribers: 22,464, Members: Companies: 14,248, Users: 37,833 Conformal Coating over No Clean Flux Residues K.Seelig, T.O'Neill; AIM Solder As the proliferation of modern day electronics continues to drive
SMTnet Express, March 12, 2015, Subscribers: 22,490, Members: Companies: 14,252 , Users: 37,867 Miniaturization with Help of Reduced Component to Component Spacing Jonas Sjoberg, Ranilo Aranda, David Geiger, Anwar Mohammed, Murad Kurwa
SMTnet Express, September 17, 2015, Subscribers: 23,487, Members: Companies: 14,646, Users: 38,975 Method for the Manufacture of an Aluminum Substrate PCB and its Advantages Joseph Fjelstad; Verdant Electronics RoHS legislated restrictions
SMTnet Express, August 20, 2015, Subscribers: 23,363, Members: Companies: 14,574, Users: 38,793 Implementing Robust Bead Probe Test Processes into Standard Pb-Free Assembly John McMahon P.Eng, Tom Blaszczyk, Peter Barber; Celestica Corporation