Novel Probing Concepts for Mass-Production Tests: Design and Challenges SMTnet Express June 15, 2012, Subscribers: 25268, Members: Companies: 8896, Users: 33235 Novel Probing Concepts for Mass-Production Tests: Design and Challenges First
Defect Coverage for Non-Intrusive Board Tests Defect Coverage for Non-Intrusive Board Tests Non-intrusive board test (NBT) is an emerging test methodology that integrates several complementary embedded-instrumentation-based test technologies