Industry Directory: silicon test wafer speccification (5)

ISE Labs

Industry Directory | Consultant / Service Provider

ISE Labs is Silicon Valley's largest Integrated Circuit Testing Laboratory. We offer a full spectrum of services related to testing of ICs.

STATS ChipPAC Inc

Industry Directory | Other

STATS ChipPAC is a leading provider of advanced semiconductor packaging and test services to global customers in the communication, consumer and computing markets.

New SMT Equipment: silicon test wafer speccification (23)

MX2000IR - Wafer AOI

MX2000IR - Wafer AOI

New Equipment | Inspection

Highly Accurate Fully Automatic Wafer Inspection with Handling Unit For semiconductor assemblies, the requirement for a precise, thorough inspection for damage and defects during the production process is especially high. Wafers need non-destructive

Viscom AG

MX100IR - Desktop Wafer AOI

MX100IR - Desktop Wafer AOI

New Equipment | Inspection

Automatic, High Accuracy Desktop Wafer Inspection For semiconductor assemblies, the requirement for a precise, thorough inspection for damage and defects during the production process is especially high. Wafers need non-destructive inspection of sur

Viscom AG

Electronics Forum: silicon test wafer speccification (1)

Books for SMT

Electronics Forum | Tue Jan 16 20:34:17 EST 2007 | davef

DAVE�S BOOKSHELF ASSEMBLER�S ESSENTIALS Title: Soldering in ElectronicsAuthor: RJ Klein WassinkPublisher: Electrochemical PublicationsISBN: 090115024XPublication date: December 1989 I know, I know. The book was written in 1989!!!! I use this b

Industry News: silicon test wafer speccification (47)

Wafer-Level Packaging Symposium (WLPS) Program Announced and Registration Now Open

Industry News | 2022-12-26 11:44:31.0

The SMTA has announced the accepted speakers for the Wafer-Level Packaging Symposium (WLPS). The symposium will be held February 14-16, 2023 at the Marriott Fremont Silicon Valley in Fremont, California.

Surface Mount Technology Association (SMTA)

International Wafer-Level Packaging Conference (IWLPC) Program Finalized and Registration Now Open

Industry News | 2012-08-02 11:47:58.0

The SMTA and Chip Scale Review magazine are pleased to announce the presentation line-up for the 9th Annual International Wafer-Level Packaging Conference.

Surface Mount Technology Association (SMTA)

Parts & Supplies: silicon test wafer speccification (1)

Juki Black Juki Spare Parts UKI 40046786 FX-3 CABLE BEAR X TSUBAKI TKP0450 58B R95

Juki Black Juki Spare Parts UKI 40046786 FX-3 CABLE BEAR X TSUBAKI TKP0450 58B R95

Parts & Supplies | SMT Equipment

Specifications: Brand Name JUKI PLASTIC RAIL Part number 40046786 Model TSUBAKI TKP0450 58B R95 Ensure Test in machine confirmation Guarantee 1 month usage for machine FX-3 FX-3R Supply all JUKI motors at lower price JUKI 40034750 R3

KingFei SMT Tech

Technical Library: silicon test wafer speccification (2)

Silicon Test Wafer Specification for 180 nm Technology

Technical Library | 1999-08-05 10:45:36.0

In 1998, the International 300 mm Initiative (I300I) demonstration and characterization programs will focus on 180 nm technology capability. To support these activities, I300I and equipment supplier demonstration partners must use starting silicon wafers with key parameters specified at a level appropriate level for 180 nm processing, including contamination and lithographic patterning. This document describes I300I's silicon wafer specifications, as developed with the I300I Silicon Working Group (member company technical advisors) and SEMI Standards.

SEMATECH

New Approaches to Develop a Scalable 3D IC Assembly Method

Technical Library | 2016-08-11 15:49:59.0

The challenge for 3D IC assembly is how to manage warpage and thin wafer handling in order to achieve a high assembly yield and to ensure that the final structure can pass the specified reliability requirements. Our test vehicles have micro-bumped die having pitches ranging from 60um down to 30um. The high density of pads and the large die size, make it extremely challenging to ensure that all of the micro-bump interconnects are attached to a thin Si-interposer. In addition, the low standoff between the die and interposer make it difficult to underfill. A likely approach is to first attach the die to the interposer and then the die/interposer sub-assembly to the substrate. In this scenario, the die/interposer sub-assembly is comparable to a monolithic silicon die that can be flip chip attached to the substrate. In this paper, we will discuss various assembly options and the challenges posed by each. In this investigation, we will propose the best method to do 2.5D assembly in an OSAT(Outsourced Assembly and Test) facility.

Invensas Corporation

Videos: silicon test wafer speccification (2)

IWLPC 2018

IWLPC 2018

Videos

Why you should attend International Wafer-Level Packaging Conference, October 23 - 25, 2018 in San Jose, California, USA.

Surface Mount Technology Association (SMTA)

Introduction to Machine Vision Part 1, Definition & Applications

Introduction to Machine Vision Part 1, Definition & Applications

Videos

This is the first in a series of 10-minute videos to introduce new users to the basics of machine vision technology. In this video, users will learn what machine vision is, how it is used in factory automation, and its four most common applications.

Microscan

Training Courses: silicon test wafer speccification (1)

Virtual Course: PCB Design for Implementing 3D and High Density Semiconductor Package Technologies

Training Courses | | | PCB Design Courses

The PCB design courses teach students the process, techniques and tools needed to design layout of printed circuit boards.

Surface Mount Technology Association (SMTA)

Events Calendar: silicon test wafer speccification (4)

Wafer-Level Packaging Symposium

Events Calendar | Tue Feb 15 00:00:00 EST 2022 - Thu Feb 17 00:00:00 EST 2022 | San Jose, California USA

Wafer-Level Packaging Symposium

Surface Mount Technology Association (SMTA)

Wafer-Level Packaging Symposium

Events Calendar | Wed Feb 14 00:00:00 EST 2024 - Fri Feb 16 00:00:00 EST 2024 | San Francisco, California USA

Wafer-Level Packaging Symposium

Surface Mount Technology Association (SMTA)

Career Center - Jobs: silicon test wafer speccification (1)

Manufacturing Process Engineer

Career Center | Charlton, Massachusetts USA | Engineering,Management,Production,Research and Development

MANUFACTURING / PROCESS ENGINEER Fused Fiber Optics company is seeking a Process Engineer to support its Optical Fabrication department. This position will be responsible for process development, optimization and troubleshooting, as well as the prep

ETS Staffing

Career Center - Resumes: silicon test wafer speccification (3)

SMT process engineer

Career Center | NORTHRIDGE, California USA | Engineering

EDUCATION BS Electronics and Communication Engineering                Gujarat University MS Electrical Engineering        California State University, Northridge  ACADAMIC PROJECT Fabrication and Characterization of Silicon Carbide (SiC) MESFE

Quality Control/Production and Management

Career Center | Melbourne, Florida USA | Management,Production,Quality Control

Technical Skills/Abilities: � Management � Quality Assurance � Strong Troubleshooting Skills � Strategic Planning � Employee Training � Quality Assurance � Problem Resolution � Mechanical/Technical Aptitude

Express Newsletter: silicon test wafer speccification (844)

Wafer-Level Packaged MEMS Switch With TSV

Wafer-Level Packaged MEMS Switch With TSV Wafer-Level Packaged MEMS Switch With TSV by: Nicolas Lietaer, Thor Bakke, Anand Summanwar; SINTEF , Per Dalsjø, Jakob Gakkestad; Norwegian Defence Research Establishment (FFI), Frank Niklaus; KTH - Royal

Partner Websites: silicon test wafer speccification (76)

Wafer Inspection and Metrology

ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/dage/wafer-inspection-and-metrology

Wafer Inspection and Metrology X-Ray Inspection and Test Products Corporate | Global Directory | Languages Division Only All of Nordson Home Products Bondtesting Systems Micro Materials Testing Wafer Inspection and Metrology X-ray Inspection Systems X-ray Counting Systems Applications Battery

ASYMTEK Products | Nordson Electronics Solutions

Core components of a sustainable world

| https://productronica.com/en/trade-fair/press/press-releases/detail/core-components-of-a-sustainable-world.html

. However, the manufacturers expect to reduce costs by switching to 300-mm wafer technology. The choice between silicon, silicon carbide and gallium nitride ultimately depends on the specific requirements of the application, including power, switching frequency, temperature and cost


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Best SMT Reflow Oven

World's Best Reflow Oven Customizable for Unique Applications
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Wave Soldering 101 Training Course
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Software programs for SMT placement and AOI Inspection machines from CAD or Gerber.
Hot selling SMT spare parts and professional SMT machine solutions

500+ original new CF081CR CN081CR FEEDER in stock