Technical Library: 20mm and 2012 (Page 1 of 4)

Design and Construction Affects on PWB Reliability

Technical Library | 2012-04-26 18:52:37.0

First presented at IPC Apex Expo 2012. The reliability, as tested by thermal cycling, of printed wire boards (PWB) are established by three variables; copper quality, material robustness and design. The copper quality was most influential and could be eva

PWB Interconnect Solutions Inc.

SMT Manufacturability and Reliability in PCB Cavities

Technical Library | 2012-05-31 18:01:31.0

First published in the 2012 IPC APEX EXPO technical conference proceedings. Considering technological advances in multi-depth cavities in the PCB manufacturing industry, various subtopics have materialized regarding the processing and application of such

AT&S

Wire Bonding and Soldering on Enepig and Enep Surface Finishes with Pure Pd-Layers

Technical Library | 2012-10-11 19:50:09.0

First published in the 2012 IPC APEX EXPO technical conference proceedings. This paper shows the benefits by using a pure palladium Layer in the ENEPIG (Electroless Nickel, Electroless Palladium, Immersion Gold) and ENEP (Electroless Nickel, Electroless P

Atotech

Novel Probing Concepts for Mass-Production Tests: Design and Challenges

Technical Library | 2012-06-15 00:43:47.0

First published in the 2012 IPC APEX EXPO technical conference proceedings. The world of spring-loaded test probes and special probes for in-circuit and functional tests have grown tremendously over the past few years. Ever increasing demands for electro

INGUN Pruefmittelbau GmbH

Effects of Tin and Copper Nanotexturization on Tin Whisker Formation

Technical Library | 2012-08-16 22:38:05.0

First published in the 2012 IPC APEX EXPO technical conference proceedings. The physical mechanisms behind tin whisker formation in pure tin (Sn) films continue to elude the microelectronics industry. Despite modest advances in whisker mitigation techniqu

Johns Hopkins Applied Physics Laboratory

Existing and Emerging Opportunities in Printed Electronics For Printers

Technical Library | 2013-05-02 12:45:25.0

Summary of some new and existing technologies for printed electronics outside of traditional membrane switch manufacturing. Discussion of requirements for understanding the technology of these applications in order to capitalize on them... First published in the 2012 IPC APEX EXPO technical conference proceedings.

Conductive Compounds, Inc.

Conformal Coating Why, What, When, and How

Technical Library | 2012-01-05 18:40:07.0

Conformal coating is applied to circuit cards to provide a dielectric layer on an electronic board. This layer functions as a membrane between the board and the environment. With this coating in place, the circuit card can withstand more moisture by incre

DfR Solutions

PLC and SCADA Networking Security Solutions

Technical Library | 2012-05-31 23:35:31.0

Industrial network security solutions essential to today's PLC - SCADA security. Lack of security on an industrial network could cause a serious threat to the system, to the personnel involved in it, in fact, production machines networks without proper se

Business Industrial Network

Assembly and Reliability of 1704 I/O FCBGA and FPBGAs

Technical Library | 2013-03-14 17:19:28.0

Commercial-off-the-shelf ball/column grid array packaging (COTS BGA/CGA) technologies in high reliability versions are now being considered for use in a number of National Aeronautics and Space Administration (NASA) electronic systems. Understanding the process and quality assurance (QA) indicators for reliability are important for low-risk insertion of these advanced electronic packages. This talk briefly discusses an overview of packaging trends for area array packages from wire bond to flip-chip ball grid array (FCBGA) as well as column grid array (CGA). It then presents test data including manufacturing and assembly board-level reliability for FCBGA packages with 1704 I/Os and 1-mm pitch, fine pitch BGA (FPBGA) with 432 I/Os and 0.4-mm pitch, and PBGA with 676 I/Os and 1.0-mm pitch packages. First published in the 2012 IPC APEX EXPO technical conference proceedings.

Jet Propulsion Laboratory

An Investigation of Whisker Growth on Tin Coated Wire and Braid

Technical Library | 2012-08-02 21:05:14.0

First published in the 2012 IPC APEX EXPO technical conference proceedings. Pure tin is a common finish for copper hook up wire, coaxial cable, ground braid and harness assemblies used on electronic assemblies. Historically there have been fewer reports o

Rockwell Collins

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