Technical Library: acetate and contamination (Page 1 of 2)

Pneumatic Stencil Cleaning Machine: Precision and Efficiency Combined

Technical Library | 2023-09-13 13:10:06.0

Pneumatic stencil cleaning machines are a great way to improve the efficiency and effectiveness of your stencil cleaning process. These machines use compressed air to remove contaminants and debris from stencils, which can cause defects and reliability issues.

I.C.T ( Dongguan Intercontinental Technology Co., Ltd. )

Online PCBA Cleaning Machine: Efficient and Effective Cleaning for Your PCBs

Technical Library | 2023-09-13 12:46:41.0

Online PCBA cleaning machines are a great way to improve the quality and reliability of your printed circuit boards (PCBs). These machines use a variety of methods to remove contaminants and debris from PCBs, including water, solvents, and ultrasonic waves.

I.C.T ( Dongguan Intercontinental Technology Co., Ltd. )

Pneumatic Stencil Cleaning Machine: Efficient and Effective Cleaning for Your Stencils

Technical Library | 2023-09-13 13:07:16.0

Pneumatic stencil cleaning machines are a great way to improve the efficiency and effectiveness of your stencil cleaning process. These machines use compressed air to remove contaminants and debris from stencils, which can cause defects and reliability issues.

I.C.T ( Dongguan Intercontinental Technology Co., Ltd. )

SMT Auto Aqueous Stencil Cleaning Machine: Improve the Quality and Efficiency of Your SMT Stencil Cleaning Process

Technical Library | 2023-09-13 13:03:25.0

SMT auto aqueous stencil cleaning machines are an essential tool for any SMT production line. These machines use a variety of methods to remove contaminants and debris from SMT stencils, which can cause defects and reliability issues.

I.C.T ( Dongguan Intercontinental Technology Co., Ltd. )

Dross and the Selective Soldering Process

Technical Library | 2011-02-24 19:20:14.0

In the selective soldering process, dross can be detrimental. Dross (and I use this term to encompass all surface contamination) is created in conjunction with the presence of Oxygen in two different areas of the process, and by separate means. Each must

SELECT Products | Nordson Electronics Solutions

Whisker Formation Induced by Component and Assembly Ionic Contamination

Technical Library | 2023-02-13 18:56:42.0

This paper describes the results of an intensive whisker formation study on Pb-free assemblies with different levels of cleanliness. Thirteen types of as-received surface-mount and pin-through-hole components were cleaned and intentionally contaminated with solutions containing chloride, sulfate, bromide, and nitrate. Then the parts were assembled on double-sided boards that were also cleaned or intentionally contaminated with three fluxes having different halide contents. The assemblies were subjected to high-temperature/high-humidity testing (85_C/85% RH). Periodic examination found that contamination triggered whisker formation on both exposed tin and solder fillets. Whisker occurrence and parameters depending on the type and level of contamination are discussed. Cross-sections were used to assess the metallurgical aspects of whisker formation and the microstructural changes occurring during corrosion.

Celestica Corporation

Latent short circuit failure in high-rel PCBs caused by lack of cleanliness of PCB processes and base materials

Technical Library | 2021-03-10 23:57:29.0

Latent short circuit failures have been observed during testing of Printed Circuit Boards (PCB) for power distribution of spacecraft of the European Space Agency. Root cause analysis indicates that foreign fibers may have contaminated the PCB laminate. These fibers can provide a pathway for electromigration if they bridge the clearance between nets of different potential in the presence of humidity attracted by the hygroscopic laminate resin. PCB manufacturers report poor yield caused by contamination embedded in laminate. Inspections show ...

European Space Agency

How Clean is Clean Enough – At What Level Does Each of The Individual Contaminates Cause Leakage and Corrosion Failures in SIR?

Technical Library | 2016-09-08 16:27:49.0

In this investigation a test matrix was completed utilizing 900 electrodes (small circuit board with parallel copper traces on FR-4 with LPI soldermask at 6, 10 and 50 mil spacing): 12 ionic contaminants were applied in five concentrations to three different spaced electrodes with five replicas each (three different bare copper trace spacing / five replications of each with five levels of ionic concentration). The investigation was to assess the electrical response under controlled heat and humidity conditions of the known applied contamination to electrodes, using the IPC SIR (surface insulation resistance) J-STD 001 limits and determine at what level of contamination and spacing the ionic / organic residue has a failing effect on SIR.

Foresite Inc.

Investigation and Development of Tin-Lead and Lead-Free Solder Pastes to Reduce the Head-In-Pillow Component Soldering Defect.

Technical Library | 2014-03-06 19:04:07.0

Over the last few years, there has been an increase in the rate of Head-in-Pillow component soldering defects which interrupts the merger of the BGA/CSP component solder spheres with the molten solder paste during reflow. The issue has occurred across a broad segment of industries including consumer, telecom and military. There are many reasons for this issue such as warpage issues of the component or board, ball co-planarity issues for BGA/CSP components and non-wetting of the component based on contamination or excessive oxidation of the component coating. The issue has been found to occur not only on lead-free soldered assemblies where the increased soldering temperatures may give rise to increase component/board warpage but also on tin-lead soldered assemblies.

Christopher Associates Inc.

Comparison of ROSE, C3/IC, and SIR as an effective cleanliness verification test for post soldered PCBA

Technical Library | 2023-04-17 21:17:59.0

The purpose of this paper is to evaluate and compare the effectiveness and sensitivity of different cleanliness verification tests for post soldered printed circuit board assemblies (PCBAs) to provide an understanding of current industry practice for ionic contamination detection limits. Design/methodology/approach – PCBAs were subjected to different flux residue cleaning dwell times and cleanliness levels were verified with resistivity of solvent extract, critical cleanliness control (C3) test, and ion chromatography analyses to provide results capable of differentiating different sensitivity levels for each test. Findings – This study provides an understanding of current industry practice for ionic contamination detection using verification tests with different detection sensitivity levels. Some of the available cleanliness monitoring systems, particularly at critical areas of circuitry that are prone to product failure and residue entrapment, may have been overlooked. Research limitations/implications – Only Sn/Pb, clean type flux residue was evaluated. Thus, the current study was not an all encompassing project that is representative of other chemistry-based flux residues. Practical implications – The paper provides a reference that can be used to determine the most suitable and effective verification test for the detection of ionic contamination on PCBAs. Originality/value – Flux residue-related problems have long existed in the industry. The findings presented in this paper give a basic understanding to PCBA manufacturers when they are trying to choose the most suitable and effective verification test for the detection of ionic contamination on their products. Hence, the negative impact of flux residue on the respective product's long-term reliability and performance can be minimized and monitored effectively.

Jabil Circuit, Inc.

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