Technical Library: agilent m2 1

Thermal Cycle Reliability Study of Vapor Phase BGA Solder Joints

Technical Library | 2012-09-13 20:45:17.0

First published in the 2012 IPC APEX EXPO technical conference proceedings. Prior to committing production boards to vapor phase soldering, we performed an evaluation to assess reliability and evaluate the vacuum soldering option. The reliability of vapor

Agilent Technologies, Inc.

Method of Modeling Differential Vias

Technical Library | 2011-03-17 15:29:54.0

Accurate, models for vias in a multilayer circuit board are necessary to predict link performance in the GHz regime. This paper describes a methodology to build a high bandwidth, scalable first approximation circuit model using simple transmission lines o

Lamsim Enterprises Inc.

5G - The Future of IoT

Technical Library | 2019-11-20 14:36:27.0

5G: The Future of IoT takes a look at the market drivers, trends and cellular technology solutions that will create our connected future. Market drivers provide added value through connectivity of all “things” ranging from street lighting to home appliances to industrial robotics. Providing connectivity to things has become easier with improvements in the economics of end devices, large investments in IoT systems, adoption of global standards and availability of spectrum. Overall trends in information technology such as cloud computing and edge cloud, artificial intelligence and security assurance have accelerated the IoT ecosystem. The whitepaper discusses some of the market segments in more details, including industrial IoT, smart cities, enterprise IoT and consumer IoT.

5G Americas

Practical Fiber Weave Effect Modeling

Technical Library | 2011-03-16 20:05:15.0

Fiber weave effect is becoming more of an issue as bit rates continue to sore upwards to 5GB/s and beyond. Due to the non-homogenous nature of printed circuit board laminates, the fiberglass weave pattern causes signals to propagate at different speeds wi

Lamsim Enterprises Inc.

Backplane Architecture High-Level Design

Technical Library | 2011-03-16 20:09:11.0

The backplane is the key component in any system architecture. The sooner one considers the backplane’s physical architecture near the beginning of a project, the more successful the project will be. This white paper introduces the concept of a backplane

Lamsim Enterprises Inc.

21st Century Semiconductor Manufacturing Capabilities

Technical Library | 1999-05-06 14:44:11.0

Semiconductor device manufacturers face many difficult challenges as we enter the 21st century. Some are direct consequences of adherence to Gordon Moore's Law, which states that device complexity doubles about every 18 months. Feature size reduction, increased wafer diameter, increased chip size, ultra-clean processing, and defect reduction among others are manifestations that have a direct bearing on the cost and quality of products, factory flexibility in responding to changing technology or business conditions, and on the timelines of product delivery to the ultimate customer.

Intel Corporation

Total Loss: How to Qualify Circuit Boards

Technical Library | 2011-05-12 19:04:05.0

We clarify the role of signal loss measurements, aka Total Loss, in specifying and qualifying circuit board materials for high-speed electronic design. We then demonstrate the NIST Multiline measurement technique in particular by characterizing test line

Connected Community Networks, Inc.

Origin and Quantification of Increased Core Loss in MnZn Ferrite Plates of a Multi-Gap Inductor

Technical Library | 2019-11-07 08:59:14.0

Inductors realized with high permeable MnZn ferrite require, unlike iron-powder cores with an inherent dis-tributed gap, a discrete air gap in the magnetic circuit to prevent saturation of the core material and/or tune the inductance value. This large discrete gap can be divided into several partial gaps in order to reduce the air gap stray field and consequently the proximity losses in the winding. The multi-gap core, realized by stacking several thin ferrite plates and inserting a non-magnetic spacer material between the plates, however, exhibits a substan-tial increase in core losses which cannot be explained from the intrinsic properties of the ferrite. In this paper, a comprehensive overview of the scientific literature regarding machining induced core losses in ferrite, dating back to the early 1970s, is provided which suggests that the observed excess core losses could be attributed to a deterioration of ferrite properties in the surface layer of the plates caused by mechanical stress exerted during machining.

Power Electronic Systems Laboratory (PES)

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