Technical Library: attended (Page 1 of 1)

IPC Apex Expo 2020 Remarks

Technical Library | 2020-03-12 14:14:07.0

IPC's APEX EXPO is always exciting & always fun and, most importantly, always beneficial to those who exhibit and attend. From technical conferences to standards committees to new and exciting things on the show floor - APEX 2020 was indeed a success

SMTnet

The Long-term Shaping of the JTAG/Boundary-scan Standards

Technical Library | 2015-05-11 21:27:52.0

Originating from the last millenium, almost three decades ago, the introduction of surface mount packaging triggered a wave of changes throughout many aspects of electronics production. A small number of talented, innovative test engineers from various big players of the industry started to attend meetings to discuss the impact of that change of technology on their future test concepts for modern assemblies. The Joint Test Action Group was born.

JTAG Technologies B. V.

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