The PARROT Clip - test probe, due to its new metal tip, is the only test probe allowing high quality testing on all contact connexions : 1) direct and 2) grip-on. The invention was awarded the Gold Medal at the World Fair of Invention,Brussels, IMPEX
Amalgamated instrument Co Pty Ltd (AIC) has a large catalogue of probes, sensors and transducers to complement their instrumentation products. Many of the sensors, especially those for pH, ORP and conductivity, are designed and manufactured in Austra
Electronics Forum | Wed Nov 17 20:11:29 EST 2021 | dwl
is there flux on the board? are you probing a test point or a soldered pad? is the probe hitting the right spot?
Electronics Forum | Sat Nov 13 03:10:36 EST 2021 | pti88
why poor contact between PCBA board and probe？ When I used ICT to test PCBA board, there was poor contact between board and probe .
Used SMT Equipment | Screen Printers
Vintage: 12/2011 Details • Automated Paste Dispenser • GridLoc System • Laser Paste Bead Height Sensor • Contrast Based 2D Inspection (paste on pad)- • Triple Track Conveyor System (66" Track Length). With Servo Driven Vision X, Y
Used SMT Equipment | Pick and Place/Feeders
Assembleon Topaz XII Pick and Place System, Includeds ATS Tray Loader Type PA269923, Front FES and Read Fixed Feeder Bar, Includes (2) FES Feeder Trolley Carts, (2) Upward Looking Cameras, Flying Nozzle Changer, 29996 Hours, Version 1.18 AUCTION IT
Industry News | 2003-06-13 09:56:46.0
Wire and spring specialist William Hughes can now offer three different versions of its PCB test point - small, large and long-legged in quantities suitable for prototype work or volume production.
Industry News | 2003-02-13 08:11:45.0
eSight Can Reduce Time-to-manufacture and Time-to-market by as Much as 80%
Parts & Supplies | SMT Equipment
contact person:banny chen mail:zksale@hysmt.cn skype:miayuan8 best quality & lower price more than we can offer 40000631 CABLE SAFETY B 40000746 CABLE CLAMP X 40001255 SENSOR CABLE GUIDE 50 40001261 SENSOR CABLE GUIDE 60 40001306 CABLE
Technical Library | 2015-08-20 15:18:38.0
Increasing system integration and component densities continue to significantly reduce the opportunity to access nets using standard test points. Over time the size of test points has been drastically reduced (as small as 0.5 mm in diameter) but current product design parameters have created space and access limitations that remove even the option for these test points. Many high speed signal lines have now been restricted to inner layers only. Where surface traces are still available for access, bead probe technology is an option that reduces test point space requirements as well as their effects on high speed nets and distributes mechanical loading away from BGA footprints enabling test access and reducing the risk of mechanical defects associated with the concentration of ICT spring forces under BGA devices. Building on Celestica's previous work characterizing contact resistance associated with Pr-free compatible surface finishes and process chemistry; this paper will describe experimentation to define a robust process window for the implementation of bead probe and similar bump technology that is compatible with standard Pb-free assembly processes. Test Vehicle assembly process, test methods and "Design of Experiments" will be described. Bead Probe formation and deformation under use will also be presented along with selected results.
Technical Library | 2012-06-15 00:43:47.0
First published in the 2012 IPC APEX EXPO technical conference proceedings. The world of spring-loaded test probes and special probes for in-circuit and functional tests have grown tremendously over the past few years. Ever increasing demands for electro
Compact and optimised for simple Gluing and Dispensing Tasks The DesktopCell is a compact, integrated solution for small to medium-sized batches and for prototype production. It unites all the advantages of a fully fledged dispensing cell and a smal
The LeanCNCell is a production system designed to handle all metering and dispensing tasks for small and medium-sized batch production. Standard applications include applying or sealing of electronic assemblies and their housings with 1D, 2D or 3D co
Training Courses | | | Other Courses
Other courses related to electronics manufacturing and assembly
Training Courses | | | PCB Inspection Courses
The PCB inspection courses focus on improving PCB yield and reliability through validation and detection of defects on electronics assemblies.
Events Calendar | Tue Feb 12 00:00:00 EST 2019 - Tue Feb 12 00:00:00 EST 2019 | ,
Webinar: BGA and Area Array Process Defects - Causes & Cures
SMTnet Express, August 20, 2015, Subscribers: 23,363, Members: Companies: 14,574, Users: 38,793 Implementing Robust Bead Probe Test Processes into Standard Pb-Free Assembly John McMahon P.Eng, Tom Blaszczyk, Peter Barber; Celestica Corporation
PCB Libraries, Inc. | https://www.pcblibraries.com/forum/RSS_ferrite-bead-symbol-and-reference-designator_topic2271.xml
PCB Libraries Forum : Ferrite Bead symbol and reference designator PCB Libraries Forum : Ferrite Bead symbol and reference designator This is an XML content feed of
Heller Industries Inc. | https://hellerindustries.com/parts/5616k/
5616K - TAPESWITCH#107-SRS(BEAD)168" Phone 1-973-377-6800 Company About News Events New Equipment Convection Reflow Ovens Reflow Oven MK7 -New
