Industry Directory | Manufacturer
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Industry Directory | Manufacturer
ICC provide Si, Ge, ZnSe, CaF2, BaF2, MgF2, BK7, Quartz,Sapphire Windows and Lenses. Grow optical fluoride crystals:CaF2 BaF2 MgF2 LiF &Silicon Produce Optical components:Optical windows ,lens,prisms,etc Other working materials:Ge
New Equipment | Test Equipment
AutoCAF™ is able to measure up to 256 individual measurement sites under conditions of high humidity and temperature in accordance with IPC-TM-650 2.6.25 Test Method & IPC 9691 CAF Test Users Guide. Conductive anodic filament (CAF) failure is copper
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Electronics Forum | Mon Sep 11 08:03:48 EDT 2006 | davef
We expect that CAF can form on a 2-layer as easily as a 4 layer board.
Electronics Forum | Tue Jul 25 08:46:50 EDT 2006 | GS
Hello all, I need to learn about Conductive Anodic Filament (CAF). All information about the phenomenon will be appreciated. About IPC TM-650 6-2-25 CAF Resistance Test, where could it be performed in European Lab ? Thanks in advance Regards....
Industry News | 2002-04-04 07:43:27.0
The Companies Will Develop and Produce Substrate Materials for High-speed Applications
Industry News | 2013-01-17 11:15:42.0
One of the “cleanest” areas on the IPC APEX EXPO® show floor will be found at the IPC/NPL Cleaning and Contamination Testing Center
Parts & Supplies | Assembly Accessories
JUKI FEEDER UPPER COVER 08 ASM Part Number: E1202706AA0 original new and copy Supply all juki smt spare parts at lower price. Part Number Feeder Model E1202706AA0 AF081E,AN081C,AF081P SM1051001SC JUKI SCREW M5 L=10 E92017150A0 JU
Parts & Supplies | Assembly Accessories
JUKI Matrix Tray 333x310x28mm for Surface Mounted Technology Machine Specifications: Brand Name JUKI Matrix Tray Part number 333x310x28mm Model Ensure Test in machine before shipping Country of Origin Made In China
Technical Library | 2023-03-16 18:57:32.0
Outline * Introduction & Background * Factors Affecting CAF Formation * CAF Formation ** Catastrophic Field Failure of Military Hardware ** Laboratory Experiments * Conclusion
Technical Library | 2021-07-27 14:49:16.0
Conductive anodic filament (CAF) formation, a failure mode in printed wiring boards (PWBs) that are exposed to high humidity and voltage gradients, has caused catastrophic field failures. CAF is an electrochemical migration failure mechanism in PWBs. In this article, we discuss CAF, the factors that enhance it, and the necessary conditions for its occurrence. Published studies are discussed, and the results of historical mean time to failure models are summarized. Potential reasons for CAF enhancement solutions are discussed, and possible directions in which to develop anti-CAF materials are proposed.
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Events Calendar | Mon Apr 23 00:00:00 EDT 2018 - Thu Apr 26 00:00:00 EDT 2018 | Shanghai, China
SMTA China East Conference 2018
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FREE Webinar: Eliminate Circuit Board Problems and Failure Modes
Imagineering, Inc. | https://www.pcbnet.com/capabilities/fabrication/materials-available/
. It is also optimized for enhanced drilling performance allowing high aspect ratio holes of less than or equal to 10 mil. Its unique resin chemistry provides CAF resistance with the benefit of long-term reliability of boards built with small feature designs
| https://ipcapexexpo.org/education/call-for-technical-paper-form
+ Harsh Environments Power Electronics Ruggedization Space/Avionics Other… Enter other… Power Electronics: Battery Technologies Yes No PCB Fabrication and Materials Topics 5G Additive and Semi-Additive Processes Black Pad and Other Board Related Defects CAF HDI Technology High Frequency High Speed High Voltage
