Technical Library: centroid data (Page 1 of 1)

Novel Pogo-Pin Socket Design for Automated Low Signal Linearity Testing of CT Detector Sensor

Technical Library | 2019-01-30 21:20:47.0

Due to the arrayed nature of the Computed Tomography (CT) Detector, high density area array interconnect solutions are critical to the functionality of the CT detector module. Specifically, the detector module sensor element, hereby known as the Multi-chip module (MCM), has a 544 position BGA area array pattern that requires precise test stimulation. A novel pogo-pin block array and corresponding motorized test socket has been designed to stimulate the MCM and acquire full functional test data. (...) This paper and presentation will focus on the socket design challenges and also key learnings from the design that can be applied to general test systems, including reliability testing. The secondary focus will be on the overall data collection and graphical user interface for the test equipment.

General Electric

Quick Study Guide to Dummy Components

Technical Library | 2000-11-13 20:48:41.0

Free 16 page reference guide includes lots of pictures. Quickly explains the most important features of SMD components.

TopLine Dummy Components

Computer Vision Face Tracking For Use in a Perceptual User Interface

Technical Library | 1999-05-07 08:57:51.0

As a first step towards a perceptual user interface, a computer vision color tracking algorithm is developed and applied towards tracking human faces. Computer vision algorithms that are intended to form part of a perceptual user interface must be fast and efficient. They must be able to track in real time yet not absorb a major share of computational resources: other tasks must be able to run while the visual interface is being used. The new algorithm developed here is based on a robust nonparametric technique for climbing density gradients to find the mode (peak) of probability distributions called the mean shift algorithm.

Intel Corporation

AOI Capabilities Study with 03015 Component

Technical Library | 2019-01-23 21:33:32.0

Automated Optical Inspection (AOI) is advantageous in that it enables defects to be detected early in the manufacturing process, reducing the Cost of Repair as the AOI systems identify the specific components that are failing removing the need for any additional test troubleshooting1-3. Because of this, more Electronic Contract Manufacturing Services (EMS) companies are implementing AOI into their SMT lines to minimize repair costs and maintain good process and product quality, especially for new component types. This project focuses on the testing of component package 03015 which is challenging for AOI.

Flex (Flextronics International)

Color Based Printed Circuit Board Solder Segmentation

Technical Library | 2010-09-30 21:07:29.0

As technology is much more advanced nowadays, electronic devices are ubiquitous in our daily life. PCB (Printed Circuit Board) plays an important role in almost every modern electronic device. However, there still is not a perfect PCB manufacturing proces

National Taiwan University

MOS Scaling: Transistor Challenges for the 21st Century

Technical Library | 1999-05-07 08:50:40.0

To enable transistor scaling into the 21st century, new solutions such as high dielectric constaConventional scaling of gate oxide thickness, source/drain extension (SDE), junction depths, and gate lengths have enabled MOS gate dimensions to be reduced from 10mm in the 1970’s to a present day size of 0.1mm. To enable transistor scaling into the 21st century, new solutions such as high dielectric constant materials for gate insulation and shallow, ultra low resistivity junctions need to be developed. In this paper, for the first time, key scaling limits are quantified for MOS transistorsnt materials for gate insulation and shallow, ultra low resistivity junctions need to be developed.

Intel Corporation

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