Electronics Forum: dynapace point to point conveyor (6)

soldering to thick gold plating

Electronics Forum | Tue Jul 11 20:13:05 EDT 2006 | davef

We agree with Chunks. You need to turn-up the heat [slow the conveyor] because you have significantly changed the melting point of the solder alloy by adding so much gold. Relative to ENIG you should expect: * Similarly smooth surface, possibly a l

Procedure to evaluate a reflow oven

Electronics Forum | Thu May 27 16:23:12 EDT 2004 | davef

Process Trials Procedures. Standard trials are often conducted on reflow ovens by production engineers during product assessment, machine approval or in process set-up. The following trials are also used by machine suppliers during equipment develop

Used SMT Equipment: dynapace point to point conveyor (6)

JOT .5M Point to Point Conveyor

JOT .5M Point to Point Conveyor

Used SMT Equipment | Conveyors

Details: • ½ m Point to Point conveyor • Crank width adjust

Lewis & Clark

JOT 1M Point to Point Conveyor

JOT 1M Point to Point Conveyor

Used SMT Equipment | Conveyors

Model: J204-02032 Vintage: 1999 Details: • 1M Point to Point conveyor • Crank width adjust • 110-120v – 50/60Hz

Lewis & Clark

Industry News: dynapace point to point conveyor (37)

MIRTEC Corp. to Exhibit Award Winning AOI Systems at IPC Midwest 2009

Industry News | 2009-08-31 13:58:22.0

OXFORD, CT — August 2009 — MIRTEC Corp., the AOI market leader in North America, announces that it will display its MV-3L Desktop AOI System, as well as its MV-7xi In-Line AOI System in booth 725 at the upcoming IPC Midwest Conference & Exhibition, scheduled to take place September 23-24, 2009 at the Renaissance Schaumburg Hotel & Convention Center in Schaumburg, IL.

MIRTEC Corporation

MIRTEC to Premier Its Technologically Advanced AOI Systems at IPC Midwest 2011

Industry News | 2011-08-22 18:45:28.0

MIRTEC, “The Global Leader in Inspection Technology” will premier its complete line of AOI systems in booth #100 at IPC Midwest 2011

MIRTEC Corporation

Technical Library: dynapace point to point conveyor (5)

Thermal Residue Fingerprinting: A Revolutionary Approach to Develop a Selective Cleaning Solution

Technical Library | 2009-07-01 09:24:25.0

During the last 5 years, the processes to remove flux residues especially for lead-free and challenging geometries have demonstrated new cleaning obstacles which have to be overcome.i A new methodology has been recently developed to further increase the propensity for successful cleaning.ii At the core of this method is the thermal identification of the residue matrix. Thermal energy changes the physical state, i.e. transitions between liquid, solid and gas phases. By taking advantage of such specific information during phase transitions, the cleaning process can be tailored to such settings, which in turn increases the cleaning success significantly.

ZESTRON Americas

Ceramic to Plastic Packaging

Technical Library | 2010-04-15 22:06:32.0

As electronic products increase in functionality and complexity, there is an emphasis on affordability, miniaturization, and energy efficiency. The telecommunications, automotive, and commercial electronic markets are the leading drivers for these trends. These markets see high volume manufacturing with millions of units priced to the fraction of the cent. The choice of the packaging material for the electrical components for these markets can have a substantial effect on the cost of the final product. Therefore plastic encapsulated components are almost universally used in non-military applications over the conventional ceramic or metal electronic packages.

Electronics Manufacturing Productivity Facility (EMPF)

Express Newsletter: dynapace point to point conveyor (438)

Partner Websites: dynapace point to point conveyor (196)

Coordinate measuring machine and vision measuring instrument-PCB magazine loader,PCB turn conveyor,p

ASCEN Technology | https://www.ascen.ltd/Blog/Solutio/508.html

. Different measuring dimensions. CMM coordinate measuring machine is based on the three-dimensional coordinates of the point to take measurements, because within the space coordinates, every point has just unique coordinate value

ASCEN Technology

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