New SMT Equipment: ferrite and chips and cracking (2)

Ferrite Chip Beads and Arrays

Ferrite Chip Beads and Arrays

New Equipment |  

Noise Suppression in Computers, Telecommunications, and consumer electronics.

AEM, Inc.

Seaamark Zhuomao 2.5D off-line x ray inspection equipment for SMD and PCBA production

Seaamark Zhuomao 2.5D off-line x ray inspection equipment for SMD and PCBA production

New Equipment | Inspection

We provide  SMT x-ray chip counter, BGA rework station and customized X-ray solution, for more information, contact me by: whatsapp:0086 134 3448 1030 skype:ritaleeli Email:sales11@zhuomao.com.cn Seaamark Zhuomao 2D off-line x ray inspection equi

Seamark Zhuomao Photoeletric technology(Shenzhen)CO., ltd

Electronics Forum: ferrite and chips and cracking (12)

BGA crack and strain gauge measurement

Electronics Forum | Mon Nov 27 08:05:50 EST 2006 | davef

There is no standard for a strain gage measurement of allowable deflection of a board or a fixture. It's possible that your fixture is causing the BGA cracking that you see. What protion of the BGA is cracking? If it is the solder connection, sear

The truth about lead-free and environment

Electronics Forum | Fri Mar 24 13:25:24 EST 2006 | patrickbruneel

See Samir that's what happens if you go too lead-free seminars, they feed you crap. If they served you lunch with bismuth chips its time you see a doctor or you end up like WML. By the way any takers?? Who in this forum volunteers to be the first to

Industry News: ferrite and chips and cracking (9)

MIRTEC to Preview the MP-520 Advanced System in Package (SiP) Inspection and Measurement System at SEMICON West 2015

Industry News | 2015-06-11 16:02:18.0

MIRTEC, "The Global Leader in Inspection Technology," will exhibit its most recent solutions for System in Package (SiP) inspection and measurement at SEMICON WEST 2015; July 14-16, 2015, at the Moscone Center in San Francisco, CA. Visitors are invited to booth # 2343 for a detailed demonstration of this exciting new technology.

MIRTEC Corp

Electronic Components, Parts and Their Function

Industry News | 2018-12-08 03:22:25.0

Electronic Components, Parts and Their Function

Flason Electronic Co.,limited

Technical Library: ferrite and chips and cracking (2)

Defect Features Detected by Acoustic Emission for Flip-Chip CGA/FCBGA/PBGA/FPBGA Packages and Assemblies

Technical Library | 2017-06-22 17:11:53.0

C-mode scanning acoustic microscopy (C-SAM) is a non-destructive inspection technique showing the internal features of a specimen by ultrasound. The C-SAM is the preferred method for finding “air gaps” such as delamination, cracks, voids, and porosity. This paper presents evaluations performed on various advanced packages/assemblies especially flip-chip die version of ball grid array/column grid array (BGA/CGA) using C-SAM equipment. For comparison, representative x-ray images of the assemblies were also gathered to show key defect detection features of the two non-destructive techniques.

Jet Propulsion Laboratory

Anisotropic grain growth and crack propagation in eutectic microstructure under cyclic temperature annealing in flip-chip SnPb composite solder joints

Technical Library | 2014-06-19 18:13:23.0

For high-density electronic packaging,the application of flip-chip solder joints has been well received in the microelectronics industry. High-lead(Pb) solders such as Sn5Pb95 are presently granted immunity from the RoHS requirements for their use in high-end flip-chip devices, especially in military applications. In flip-chip technology for consumer electronic products, organic substrates have replaced ceramic substrates due to the demand for less weight and low cost. However, the liquidus temperatures of high-Pb solders are over 300°C which would damage organic substrates during reflow because of the low glass transition temperature. To overcome this difficulty, the composite solder approach was developed...

National Chiao Tung University

Videos: ferrite and chips and cracking (1)

YINCAE SMT 266 Jetting Application Process

YINCAE SMT 266 Jetting Application Process

Videos

http://yincae.com/index.html YINCAE SMT 256 Dipping Process YINCAE SMT 266 Jetting Process

YINCAE Advanced Materials, LLC.

Express Newsletter: ferrite and chips and cracking (401)

SMTnet Express - November 7, 2019

SMTnet Express, November 7, 2019, Subscribers: 32,325, Companies: 10,919, Users: 25,284 Origin and Quantification of Increased Core Loss in MnZn Ferrite Plates of a Multi-Gap Inductor Credits: Power Electronic Systems Laboratory (PES) Inductors

SMTnet Express - October 28, 2021

SMTnet Express, October 28, 2021, Subscribers: 26,544, Companies: 11,461, Users: 26,907 Cracks: The Hidden Defect Cracks in ceramic chip capacitors can be introduced at any process step during surface mount assembly. Thermal shock

Partner Websites: ferrite and chips and cracking (28)

Underfill Evolution - Get Your Handbook

ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/asymtek/your-process/applications-corner/underfill-evolution

. As chip populations increase, dispensing applications must deliver smaller and smaller amounts of fluid with precision and consistency within small form factors and into micron-sized gaps between chips and components

ASYMTEK Products | Nordson Electronics Solutions


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