Technical Library: fuji leader

Evaluating Automated Wafer Measurement Instruments

Technical Library | 1999-08-05 09:34:44.0

This document demonstrates a sequential process of evaluating automated wafer instruments and discusses why this approach is useful for studying instruments that have automation features such as loading and focusing mechanisms. The methodology specifies a series of experiments consisting of two or more capability studies followed by a stability study. Each experiment achieves a separate goal, yet combines with the others in providing information needed to assess the usefulness of the instrument.

SEMATECH

  1  

fuji leader, unloader searches for Companies, Equipment, Machines, Suppliers & Information

Online IPC Training & Certification

PCB Assembly Supplies - ONLINE STORE
PCB AOI

Easily dispense fine pitch components with ±25µm positioning accuracy.
https://pages.zestron.com/zestron-analytical-support-services

Best Reflow Oven
High Throughput Reflow Oven

ONLINE IPC Training & Certification
SMT fluid dispenser

回流焊炉