Industry Directory: lel international (1)

LEL Tech

LEL Tech

Industry Directory | Equipment Dealer / Broker / Service Provider

Purchasing, Servicing, & Selling Pre-Owned Production Equipment Throughout the EMS Industry. Specializing In: SMT & PCB Assembly, Test, CNC, Microscopy, and Facility Equipment

New SMT Equipment: lel international (3)



New Equipment | Industrial Automation

Want to buy best parts with a competitive price ? Please check it with ! we will response you in 24 hours! Contact: Sandy Lin Skype:onlywnn_1 Telegram:+8618020776786 Mobile(Whatsapp): (+86)-18020776786 QQ

Moore Automation



New Equipment | Industrial Automation

  Sandy.[]    Sandy.[WhatsApp/Skype/Mobile:+8618020776786]     Sandy.[Quote to you within the shortest possible time with our best price]   Warranty: up to 12 months Shipping: fast delivery is available NEW+ORIGINAL+IN STOCK+ONE


Used SMT Equipment: lel international (1)

YesTech YTV-BX

YesTech YTV-BX

Used SMT Equipment | AOI / Automated Optical Inspection

*Owned by LEL International* Video Demo Available Vintage: 2013 Operating System: Windows XP Pro Details: • 5MP camera • 3D Fusion Lighting • CAD import, export, and conversion software • SPC data collection and reportin

LEL Tech

Technical Library: lel international (2)

Next-Generation Test Equipment For High-Volume Wafer Production

Technical Library | 2010-06-23 21:59:03.0

Quality control is one of the main bottlenecks in the production of micro-opto-electromechanical systems/microelectromechanical systems (MOEMS/MEMS) because each structure on a wafer is serially inspected and scanned stepwise over the entire wafer area.

SPIE - International Society for Optical Engineering

Effects of Package Warpage on Head-in-Pillow Defect

Technical Library | 2017-07-06 15:50:17.0

Head-in-pillow (HiP) is a BGA defect which happens when solder balls and paste can't contact well during reflow soldering. Package warpage was one of the major reasons for HiP formation. In this paper, package warpage was measured and simulated. It was found that the package warpage was sensitive to the thickness of inside chips. A FEM method considering viscoelastic property of mold compound was introduced to simulate package warpage. The CTE mismatch was found contributes to more than 90% of the package warpage value when reflowing at the peak temperature. A method was introduced to measure the warpage threshold, which is the smallest warpage value that may lead to HiP. The results in different atmospheres showed that the warpage threshold was 50μm larger in N2 than that in air, suggesting that under N2 atmosphere the process window for HiP defects was larger than that under air, which agreed with the experiments.

Samsung Electronics

Express Newsletter: lel international (853)

lel international searches for Companies, Equipment, Machines, Suppliers & Information

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ISVI - Industrial Sensor Vision International Corporation
ISVI - Industrial Sensor Vision International Corporation

Industrial Sensor Vision International specializes in advanced camera technology of high resolution fast speed cameras for automation, AOI, 2-D/3-D, SPI inspection and wafer inspection.


3 Morse Road 2A
Oxford, CT USA

Phone: +1 203 592 8723

2021 IPC Training Schedule

Real Time Process Control BREAKTHROUGH for Dispensing Industry.
PCB Handling with CE

Best Reflow Oven

MSD storage in desiccant dry canbinets