Industry Directory: run error # 1 (1)

Advanced Assembly, LLC.

Industry Directory | Manufacturer of Assembled PCBs / Assembly / Contract Manufacturer / Service Provider

Advanced Assembly provides quality PCB assembly services for prototypes and low-quantity orders 87% faster than other shops.

New SMT Equipment: run error # 1 (334)

Smart Factory 1.0

Smart Factory 1.0

New Equipment | Other

Smart Factory 1.0 The Pillarhouse Smart Factory 1.0 implementation allows a customer to monitor the performance of all their Pillarhouse Selective Soldering Systems. This can be across a single production line, a production facility or even across

Pillarhouse USA

3d Optical Coordinate Measuring Machine

3d Optical Coordinate Measuring Machine

New Equipment | Inspection

3d Optical Coordinate Measuring Machine price  is a precise and effective non-contact optical measuring instrument. It is composed of a series of accessories, such as color CCD Camera & adapter, zoom lens capture card, linear scale

ASCEN Technology

Electronics Forum: run error # 1 (478)

Fuji Recovery #

Electronics Forum | Mon Aug 11 11:51:53 EDT 2003 | ServGuy

Personally, I'd run 1 time recovery, and depending on chip-shooter model, I'd use 2nd station parts detection on larger parts with error stop. The situation you decribe, a couple caps an hour would'nt stop the machine unless they came from the same f

Fuji Recovery #

Electronics Forum | Mon Aug 11 11:52:05 EDT 2003 | ServGuy

Personally, I'd run 1 time recovery, and depending on chip-shooter model, I'd use 2nd station parts detection on larger parts with error stop. The situation you decribe, a couple caps an hour would'nt stop the machine unless they came from the same f

Used SMT Equipment: run error # 1 (13)

Tyco SEP 3T

Tyco SEP 3T

Used SMT Equipment | General Purpose Equipment

Year 2008 - Like New Condition Tyco SEP 3T Shuttle Electric Press Standalone electric press for the application of PCBs onto compliant pin housings or connectors • Servo electric press with shuttle system for product location under press ram • Ho

1st Place Machinery Inc.

Agilent 71612B

Agilent 71612B

Used SMT Equipment | In-Circuit Testers

Agilent 71612B-UHF Digital Transmission Tester 12Gb/s The 71612B error performance analyzer addresses applications for high speed digital testing up to 12 Gb/s, including R&D and manufacturing test of lightwave components and sub-assemblies, ad

Test Equipment Connection

Industry News: run error # 1 (66)

Technical conference paper abstracts and course proposals are due February 27, 2020. To submit an abstract or course proposal, contact Brook Sandy-Smith, IPC technical conference program manager. # #

Industry News | 2020-02-18 14:55:07.0

Team offers its expertise in conformal coating and fluid dispensing equipment solutions for Swiss electronics manufacturing

Nordson ASYMTEK

Pantera X-plus – Essemtec’s Proven Pick-and-Place System for Small Batches

Industry News | 2014-04-24 03:37:36.0

With more than 1500 installations worldwide, the Pantera X pick-and-place system from Essemtec offers new benefits for highly flexible small batch assembly. The field-proven machine was further developed and supplemented in order to better cover the ever-increasing demands for future component accuracy and diversity.

ESSEMTEC AG

Technical Library: run error # 1 (1)

Creating Reusable Manufacturing Tests for High-Speed I/O with Synthetic Instruments

Technical Library | 2020-07-08 20:05:59.0

There is a compelling need for functional testing of high-speed input/output signals on circuit boards ranging from 1 gigabit per second (Gbps) to several hundred Gbps. While manufacturing tests such as Automatic Optical Inspection (AOI) and In-Circuit Test (ICT) are useful in identifying catastrophic defects, most high-speed signals require more scrutiny for failure modes that arise due to high-speed conditions, such as jitter. Functional ATE is seldom fast enough to measure high-speed signals and interpret results automatically. Additionally, to measure these adverse effects it is necessary to have the tester connections very close to the unit under test (UUT) as lead wires connecting the instruments can distort the signal. The solution we describe here involves the use of a field programmable gate array (FPGA) to implement the test instrument called a synthetic instrument (SI). SIs can be designed using VHDL or Verilog descriptions and "synthesized" into an FPGA. A variety of general-purpose instruments, such as signal generators, voltmeters, waveform analyzers can thus be synthesized, but the FPGA approach need not be limited to instruments with traditional instrument equivalents. Rather, more complex and peculiar test functions that pertain to high-speed I/O applications, such as bit error rate tests, SerDes tests, even USB 3.0 (running at 5 Gbps) protocol tests can be programmed and synthesized within an FPGA. By using specific-purpose test mechanisms for high-speed I/O the test engineer can reduce test development time. The synthetic instruments as well as the tests themselves can find applications in several UUTs. In some cases, the same test can be reused without any alteration. For example, a USB 3.0 bus is ubiquitous, and a test aimed at fault detection and diagnoses can be used as part of the test of any UUT that uses this bus. Additionally, parts of the test set may be reused for testing another high-speed I/O. It is reasonable to utilize some of the test routines used in a USB 3.0 test, in the development of a USB 3.1 (running at 10 Gbps), even if the latter has substantial differences in protocol. Many of the SI developed for one protocol can be reused as is, while other SIs may need to undergo modifications before reuse. The modifications will likely take less time and effort than starting from scratch. This paper illustrates an example of high-speed I/O testing, generalizes failure modes that are likely to occur in high-speed I/O, and offers a strategy for testing them with SIs within FPGAs. This strategy offers several advantages besides reusability, including tester proximity to the UUT, test modularization, standardization approaching an ATE-agnostic test development process, overcoming physical limitations of general-purpose test instruments, and utilization of specific-purpose test instruments. Additionally, test instrument obsolescence can be overcome by upgrading to ever-faster and larger FPGAs without losing any previously developed design effort. With SIs and tests scalable and upward compatible, the test engineer need not start test development for high-speed I/O from scratch, which will substantially reduce time and effort.

A.T.E. Solutions, Inc.

Videos: run error # 1 (8)

This is a running demon of the koh Young KY-3030 VAL Solder Paste Inspection machine.  The video shows the machine catching an error introduced in the solder paste print.

This is a running demon of the koh Young KY-3030 VAL Solder Paste Inspection machine. The video shows the machine catching an error introduced in the solder paste print.

Videos

Facilities: 220VAC, 1phase, 50/60Hz, 10Amp / Air: 0.4 - 0.5 Mpa Dimms: 40 X 51 X 57 in. @ 1654 lbs Product Terms: This unit is located in the CEE facility in the Chicago area. A CEE technician will demonstrate the unit fully functi

Capital Equipment Exchange

PCB Router Cutting Machine ML 2500S

PCB Router Cutting Machine ML 2500S

Videos

ML-2500S PCB Separator uses high speed rotation milling cutter to separate PCB array. Widely applied in digital, communication, lighting, etc. Which improved the defect on PCB separating caused by manual, V-cut, stamping, etc If you have any questi

Qinyi Electronics Co.,Ltd

Career Center - Resumes: run error # 1 (3)

TECHNICIAN

Career Center | THRISSUR, India | Maintenance,Production

HANDLING OF MAINTENANCE Camelot,Mascot, Selective Soldering,Wave Soldering,Aquastorm 200,H-500 HI-Z,Kolb,kerry&PBT,GETECH, ATI 105 & Final Touch 101,Heller,Btu&vapour phase,Shuttle,SRT,ESD ,Electrical maintenance . Knowledge in using SLIM KIC 2000&

rozenblit1

Career Center | , Israel | Engineering,Maintenance,Technical Support

I was born on June , 1972 in Khmelnitsky city , Ukraine . I am male. From 1979 to 1987 I was studying at secondary school #7, having finished which I entered the Technical College of Khmelnitsky in specialty Machine Tools with Computer Numeric Contr

Express Newsletter: run error # 1 (770)

SMT Express, Issue No. 4 - from SMTnet.com

SMT Express, Issue No. 4 - from SMTnet.com Volume 1, Issue No. 4 Tuesday, September 14, 1999 Featured Article Return to Front Page CFM Increases First-pass Yield by Bob Bilbrough, Quality Contract Manufacturing, LLC This article is based upon

Partner Websites: run error # 1 (2386)

HELLER Capacitor Run Induction Motor JF1F071N 1809

| https://www.feedersupplier.com/sale-13872136-heller-capacitor-run-induction-motor-jf1f071n-1809.html

Parts HELLER Capacitor Run Induction Motor JF1F071N 1809 Basic Information Place of Origin: USA Brand Name: Heller Model Number: JF1F071N 1809 Minimum Order Quantity: 1 piece Price: $1

HDF BLANK RUN TAPE – Wintech Service & Marketing Sdn Bhd

| https://www.wintech.my/product/hdf-blank-run-tape/

HDF BLANK RUN TAPE – Wintech Service & Marketing Sdn Bhd Skip to content Call Us Now +604-380 9899 Spare Parts & Equipment sales@wintech.my Home About Us SMT/AI Spare Parts SMT/AI Equipment Services Gallery Contact Us Home SMT/AI SPARE PARTS SMT SPARE PARTS HDF BLANK RUN TAPE Search for


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