Technical Library: secondary and injection and test and set (Page 1 of 3)

Hand Soldering, Electrical Overstress, and Electrostatic Discharge

Technical Library | 1999-05-09 13:07:16.0

This paper will give the reader a general understanding of EOS and ESD phenomena. It specifically addresses hand soldering's role in EOS and ESD and how to protect against and test for potential problems. It discusses how Metcal Systems address EOS and ESD concerns and how they differ from conventional soldering systems.

Metcal

Lead-free and Tin-lead Assembly and Reliability of Fine-pitch Wafer-Level CSPs

Technical Library | 2007-05-31 19:05:55.0

This paper discusses solder paste printing and flux dipping assembly processes for 0.4 and 0.5mm pitch lead-free WLCSPs and the corresponding assembly results and thermal cyclic reliability obtained. Variables evaluated include reflow ambient, paste type, and stencil design. Reliability is also compared to results for the same components assembled under identical conditions using SnPb solder.

Universal Instruments Corporation

Mixed Voltages And Aluminum Conductors: Assesing New Electrcal Technology

Technical Library | 2018-02-07 22:50:31.0

The architecture of vehicle electrical systems is changing rapidly. Electric and hybrid vehicles are driving mixed voltage systems, and cost pressures are making conductor materials like aluminum an increasingly viable competitor to copper. This paper presents tradeoff studies at the vehicle level, and how to automatically generate an electrical Failure Mode Effects and Analysis (FMEA) report, as well as how to optimize wire sizes for both copper and aluminum at the platform level.

Mentor Graphics

Facility Fluids Metrics and Test Methods

Technical Library | 1999-08-05 10:52:56.0

This technology transfer was prepared by the Research Triangle Institute (RTI) as part of SEMATECH's Facility Fluids Project (S100). It is a compilation of information on existing facility fluids metric and test methods. Information on standard methods was gathered from SEMATECH and SEMI. Other information was obtained from a literature search of journals and conference proceedings. The published information primarily is concerned with the test equipment used and what levels of detection and purity were found. Many of the articles discussed the use of new equipment, either commercial or experimental. Extensive annotated bibliographies are append to the report.

SEMATECH

Screen Making for Printed Electronics- Specification and Tolerancing

Technical Library | 2018-03-28 14:54:36.0

Six decades of legacy experience makes the specification and production of screens and masks to produce repeatable precision results mostly an exercise in matching engineering needs with known ink and substrate performance to specify screen and stencil characteristics. New types of functional and electronic devices, flex circuits and medical sensors, industrial printing, ever finer circuit pitch, downstream additive manufacturing processes coupled with new substrates and inks that are not optimized for the rheological, mechanical and chemical characteristics for the screen printing process are becoming a customer driven norm. Many of these materials do not work within legacy screen making, curing or press set-up parameters. Many new materials and end uses require new screen specifications.This case study presents a DOE based method to pre-test new materials to categorize ink and substrate rheology, compatibility and printed feature requirement to allow more accurate screen recipes and on-press setting expectations before the project enters the production environment where time and materials are most costly and on-press adjustment methods may be constrained by locked, documented or regulatory processes, equipment limitations and employee experience.

Hazardous Print Consulting Inc

Thermal Shock and Drop Test Performance of Lead-free Assemblies with No-Underfill and Corner-Underfill

Technical Library | 2014-01-02 15:56:55.0

With ROHS compliance the transition to lead-free is inevitable. Several lead-free alloys are available in the market and its reliability has been the main concern. The results from this experimental research aims at making a comparison of different lead-free alloy combinations. Thermal shock and drop tests are a part of this experimental study.

Jet Propulsion Laboratory

Intel StrataFlash™ Memory Development and Implementation

Technical Library | 1999-05-07 10:13:38.0

This paper will review the device physics governing the operation of the industry standard ETOX™ flash memory cell and show how it is ideally suited for multiple bit per cell storage, through its storage of electrons on an electrically isolated floating gate and through its direct access to the memory cell.

Intel Corporation

Best Practices in Selecting Coatings and Pottings for Solar Panel Systems; Junction Boxes and Inverters

Technical Library | 2020-08-13 01:12:57.0

The solar industry has driven solutions that result in electronics systems that are required to perform in outside environments for over 25 years. This industry expectation has resulted in solutions to protect the electronics from failure that can result from interaction with moisture, and various chemicals leading to corrosion and shorting of the systems. Potting and encapsulation compounds can impart the very high level of protection from environmental, thermal, chemical, mechanical, and electrical conditions that the solar applications demand.

DfR Solutions

Evaluation, Selection and Qualification of Replacement Reworkable Underfill Materials

Technical Library | 2019-02-27 15:23:47.0

A study was performed to investigate, evaluate and qualify new reworkable underfill materials to be used primarily with ball grid arrays (BGAs), Leadless SMT devices, QFNs, connectors and passive devices to improve reliability. The supplier of the sole source, currently used underfill, has indicated they may discontinue its manufacture in the near future. The current underfill material is used on numerous circuit card assemblies (CCAs) at several sites and across multiple programs/business areas. In addition, it is used by several of our contract CCA suppliers.The study objectives include evaluation of material properties for down select, dispensability and rework evaluation for further down select, accelerated life testing for final selection and qualification; and process development to implement into production and at our CCA suppliers. The paper will describe the approach used, material property test results and general findings relative to process characteristics and rework ability.

Northrop Grumman Corporation

Comparing Soldering Results of ENIG and EPIG Post Steam Exposure

Technical Library | 2020-11-15 21:01:24.0

ENIG, electroless nickel immersion gold is now a well-regarded finish used to enhance and preserve the solder-ability of copper circuits. EPIG, electroless palladium immersion gold, is a new surface finish also for enhancing and preserving solder-ability but with the advantage of eliminating Electroless Nickel from the deposit layer. This feature has become increasingly important with the increasing use of high frequeny PWB designs whereby nickel's magnetic properties are detrimental. We examine these two finishes and their respective soldering characteristics as plated and after steam aging and offer an explanation for the performance deviation.

Uyemura International Corporation

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