New Equipment | Test Equipment
Teradyne's TestStation Multi-Site systems deliver 2 to 4 times greater test capacity, delivering 200 to 400% greater productivity, and 40 to 50% lower total cost of test compared to a conventional single site system. Supporting a full range of MDA/IC
New Equipment | Test Equipment
Configurable up to 15,360 Test Points TestStation LX2 is Teradyne's largest pin count in-circuit test system. Configurable up to 15,360 pins, TestStation LX2 utilizes the new UltraPin II 128HD pin card for testing large, complex, and heavily-integr
New Equipment | Test Equipment
Teradyne's TestStation High-Speed Inline Automated Handler is compatible with TestStation Multi-Site Inline configurations designed for the most productive and lowest cost in-circuit test package. Advantages The TestStation Automated Inline Handl
New Equipment | Test Equipment
Affordable In-Circuit Test The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologie
New Equipment | Test Equipment
Reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies. TestStation in-circuit test systems provide full structural and functional coverage for a wide range of manufacturing, component, process,
New Equipment | Test Equipment
Because all of Digitaltest's systems provide a non-multiplexed(1:1) archetecture, and digital driver/sensors that support 10V and low voltage logic, migration can be a simple operation. Details of each solution can be found at www.digitaltest.net.
Improve test coverage and reduce cost. The XJTAG XJLink2-CFM adds the power of XJTAG’s boundary scan solution to the Teradyne TestStation, giving test access to hard-to-probe parts of a board. Both JTAG and non JTAG devices, such as Flash, RAM, Eth
New Equipment | Test Equipment
Limited access testing using IEEE1149.1 standard are now an essential part of manufacturing test strategy for complex and high node count digital boards. The Boundary scan tools (Scan Pathfinder) provided by Teradyne for the 228x and TestStation seri
New Equipment | Test Equipment
True Parallel Test The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs. It effectively doubles the test throughput of conventional
New Equipment | Test Equipment
Intrinsic Quality’s engineers stand at the forefront of ICT (In Circuit Test) development, and are ready to optimize your programming and fixture design for solutions from GenRad – Teradyne. Our engineers design exceptional streamlined test developme
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