Industry Directory: tescon ict 70 (5)

Shenzhen ETA Technology Co., Ltd

Shenzhen ETA Technology Co., Ltd

Industry Directory | Contract Manufacturer / Equipment Dealer / Broker

I.C.T is the world's leading provider of SMT factory planning solutions, providing SMT Machine, More than 25 years of experience.

New SMT Equipment: tescon ict 70 (79)

I.C.T PCB LED Dispensing Machine

I.C.T PCB LED Dispensing Machine

New Equipment | Dispensing

I.C.T​ PCB LED Dispensing Machine​ If you could not find any similar items you want, you may send some photos to us. because our catalog and website haven't included all of our products. smt,Dispensing Machine,SMT Glue Dispensing Machine,Dispensing

Shenzhen ETA Technology Co., Ltd

Dual-rails PCB Magazine Loader SMT Unloader​

Dual-rails PCB Magazine Loader SMT Unloader​

New Equipment | Board Handling - Conveyors

Dual-rails PCB Magazine Loader SMT Unloader​ If you could not find any similar items you want, you may send some photos to us. because our catalog and website haven't included all of our products. PCB conveyor, PCB magazine loader, PCBA coating con

Shenzhen ETA Technology Co., Ltd

Electronics Forum: tescon ict 70 (10)

Whoa!!!! Re: Flying Probe ICT

Electronics Forum | Mon Aug 24 18:34:31 EDT 1998 | Steve Evers

Any competition for Teradyne on this front? Any users out there with comments? Thanks in advance. G If your new to the world of Fying Probe ICT you may think this is a new developement. Its not, this technology has been around for 10+ years. M

Flying Probe Testers?

Electronics Forum | Mon Aug 17 10:23:35 EDT 1998 | Steve Gregory

Good Day All!! I hope ya'll had a decent weekend, I did...didn't do a damn thing, I like weekends like that. Anyways, the big guys here are thinking about buying a "Flying Probe" tester, and the G.M. came to me and asked what I thought of them. I ha

Used SMT Equipment: tescon ict 70 (1)

SPEA FP 4040 HI-LINE SERIES 5 Flying Probe Tester (2004)

SPEA FP 4040 HI-LINE SERIES 5 Flying Probe Tester (2004)

Used SMT Equipment | In-Circuit Testers

SPEA 4040 Flying Probe with Boundry Scan Model: FP 4040 HI-LINE SERIES 5 Flying Probe Tester Year: 2004 S/N: SWE537FF 4040 Hi Line; high speed high accuracy (1) DRIV-10 V/I Generator; Precision Driver, 4Q, +/-10V, +/- 1A (1) Boost-80 V/I Gene

Tekmart International Inc.

Industry News: tescon ict 70 (6)

Christopher Associates Premiers Solder Pastes from Koki for ICT Performance and Fine-Pitch Printing

Industry News | 2009-12-14 20:45:09.0

December 2009 ? Christopher Associates, a pioneering supplier and distributor to the electronics and chemical processing industries, introduces two new solder pastes from Koki Company Ltd. (Tokyo, Japan).

Christopher Associates Inc.

Digitaltest to announce their FAQ (Fast, Accurate, Quality) suite of test and quality management solutions for high reliability products at IPC APEX 2015.

Industry News | 2015-02-17 10:38:29.0

At IPC APEX 2015 Digitaltest are showing the integration of all test processes to accurately locate defects, increase fault coverage, provide the focus to improve your process and increase quality.

Digitaltest Inc.

Parts & Supplies: tescon ict 70 (25)

Fuji Fuji NXT H04 15.0G nozzle AA07M09

Fuji Fuji NXT H04 15.0G nozzle AA07M09

Parts & Supplies | Pick and Place/Feeders

Fuji NXT H04 15.0G nozzle AA07M09 Fuji nozzle on sale Brand Machine Model Specification Fuji CP3 / CP4 Nozzle Bore diameter 0.7 / 1.0 / 1.3 Fuji CP6 / CP7 Nozzle Bore diameter 0.7 / 1.0 / 1.3 / 1.8 Fuji CP6 / CP7 Nozzle Bore diameter 2.5 / 3.7

ZK Electronic Technology Co., Limited

Philips SMT nozzle holder

Philips SMT nozzle holder

Parts & Supplies | Pick and Place/Feeders

1.Short leadtime; 2.Quality guaranteed; 3.all size and model available. Through years of efforts,we've developed a wide range of SMT nozzle holder for various machines including but not limited to FUJI, JUKI, KME, PANASERT, SAMSUNG, SANYO, SO

Goodluck Electronic Equipment Co.,Ltd

Technical Library: tescon ict 70 (10)

Investigation of Device Damage Due to Electrical Testing

Technical Library | 2012-12-14 14:28:20.0

This paper examines the potential failure mechanisms that can damage modern lowvoltage CMOS devices and their relationship to electrical testing. Failure mechanisms such as electrostatic discharge (ESD), CMOS latch-up, and transistor gate oxide degradation can occur as a result of electrical over-voltage stress (EOS). In this paper, EOS due to electrical testing is examined and an experiment is conducted using pulsed voltage waveforms corresponding to conditions encountered during in-circuit electrical testing. Experimental results indicate a correlation between amplitude and duration of the pulse waveform and device degradation due to one or more of the failure mechanisms.

Worcester Polytechnic Institute

Comparing Costs and ROI of AOI and AXI

Technical Library | 2013-08-07 21:52:15.0

PCB architectures have continued their steep trend toward greater complexities and higher component densities. For quality control managers and test technicians, the consequence is significant. Their ability to electrically test these products is compounded with each new generation. Probe access to high density boards loaded with micro BGAs using a conventional in-circuit (bed-of-nails) test system is greatly reduced. The challenges and complexity of creating a comprehensive functional test program have all but assured that functional test will not fill the widening gap. This explains why sales of automated-optical and automated X-ray inspection (AOI and AXI) equipment have dramatically risen...

Teradyne

Career Center - Resumes: tescon ict 70 (1)

B-Tech/4+Exp as an Service & Production

Career Center | CHENNAI, TAMILNADU India | Engineering,Maintenance,Production,Quality Control,Technical Support

4 years of hands on experience in SMT manufacturing and Process Development where my duties include Programming of SMT machines for different PCBs, operation, process study and maintenance of SMT machines.. Reflow Oven Profiling, according to new d

Express Newsletter: tescon ict 70 (110)

Partner Websites: tescon ict 70 (24)

WEISS WT 120/70 Test Chamber_ID 112782: World Equipment Source

| https://www.wesource.com/batch-ovens-and-chambers/weiss-wt-120/70-test-chamber-id-112782/

WEISS WT 120/70 Test Chamber_ID 112782: World Equipment Source COMPANY PROFILE FINDER'S PROGRAM R1-Surplus Wesource159   CALL US: 858.693.1991 Home About Us Contact Us Categories AOI Assembleon Machines Assembleon Parts Batch Ovens and Chambers Component Counters/Tapers Component Placers

In-Circuit Testing Services - Southwest Systems Technology

| https://www.swsystems.com/product/in-circuit-testing-services/

future test requirements. We can provide remote or on-site support on an ongoing basis as well. Our ICT test engineers have over 70 years


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