TR7600XM SII and TR7600XLL SII are high performance and high speed 3D AXI for the largest server, networking and power PCBs. The TR7600XM SII and TR7600XLL SII systems use TRI's unique shadow-free technology to inspect multi-layer boards with 2/3-lay
TR7600XLL SII CT is high performance and high speed 3D AXI for the largest server, networking and power PCBs. The TR7600XLL SII system uses TRI's unique shadow-free technology to inspect multi-layer boards with 2/3-layer PoPs, µBGAs, QFNs and Press-f
Industry News | 2019-11-27 12:21:14.0
Test Research, Inc. (TRI) will join NEPCON Japan held at Tokyo Big Sight to showcase state-of-the-art Inspection Solution for Smart Factories. Visit booth #W1-42 to experience Smart Factory Inspection Solutions in action.
Industry News | 2019-01-06 21:27:59.0
[December 14, 2018 – San Jose, CA] Test Research, Inc. (TRI), the leading test and inspection solutions provider for the electronics manufacturing industry will join IPC APEX EXPO 2019 held at San Diego Convention Center to showcase its Smart Factory inspection and test solutions for the printed circuit board electronics manufacturing industry. Visit TRI at booth #2533 on January 29 – January 31, 2019 to discover the newest innovations in 3D SPI, 3D AOI, 3D CT AXI and multicore ICT.