Industry Directory | Manufacturer
RENICE SSDs line vary on form factor, interface, MLC or SLC NAND, industrial temperature and with or without Secure erase/ Power-failure protection, AES Encryption, Write-protect function.Your best partner on storage devices.
YAMAHA Second-Hand YV180XG Pick and Place Machine Model YV180XG Panel size L Type: Max L380 x W330 mm ∼ Min L50 x W50 mm Panel thick 0.4 ~ 3.0 mm Mounting ±0.05 mm (0.01mm control) Mounting an
.png)
Sector Specification(CM202-DS) Specification(CM201-DS) ModelNo. KXF-E24C KXF-E14C TactTime 0.088sec/chip 0.176sec/chip B'd change: 3.0 sec Centering method: Upward Vision PCB Size(L x
Electronics Forum | Thu Oct 30 14:07:29 EDT 2008 | jdumont
We use a normal off the shelf (Best Buy) mini fridge. As far as the temp readings, I got some USB dataloggers from Omega and stick them in there. Download the data to your PC every couple of weeks (Outlook reminder). I also use these for our Nitrogen
Electronics Forum | Fri Aug 26 10:55:31 EDT 2022 | kumarb
a DOS USB stack will be required. If Windows -> the USB driver for this device will be required. If Juki has a custom OS then even less of a chance of a success. In all cases, you are introducing far too many layers of unnecessary software that is d
Used SMT Equipment | Chipshooters / Chip Mounters
Refurbished YV180XG Pick and Place Machine Panel size L Type: Max L380 x W330 mm ∼ Min L50 x W50 mm Panel thick 0.4 ~ 3.0 mm Mounting ±0.05 mm (0.01mm control) Mounting angle ±180° (0.01° control) Mounting speed 0.095 se
Used SMT Equipment | Chipshooters / Chip Mounters
Product name: YV100X YAMAHA multi-functional chip mounter Product number: YV100X Products in detail YAMAHA multi-function placement machineYAMAHA YV100X substrate size: ATS20 (end to put) W -AT assembly: L460 * W250 (Max)/L50 * W50 (Min)sub
Industry News | 2010-10-30 02:09:14.0
The premiere of Electronics Midwest, a joint production of IPC – Association Connecting Electronics Industries® and UBM Canon, was a confirmed win-win-win success for exhibitors, attendees and organizations alike.
Industry News | 2008-07-24 17:38:17.0
Scotts Valley, CA � 15 July, 2008 - Vertical Circuits, Inc.(VCI), a leading supplier of advanced 3D die-level interconnect solutions, today announced its recognition of Asymtek, a Nordson company (Nasdaq: NDSN) and leader in dispensing, coating and jetting technologies, as a �Partner in Innovation.� Asymtek's Axiom� automated dispensing system plays a key role in enabling the high-volume manufacturing capability for VCI's 3D vertical interconnect process.
Parts & Supplies | Screen Printers
DEK Wiping mechanism magnet spring-G0332 (FLEXO) MORE DEK PARTS IN STOCKS DEK STEPPER MOTOR 140452-181245 DEK SPRING SHAFT KIT 145884 DEK SPRING G0332 DEK SOLVENT PUMP ASSY 191088 DEK SOLVENT 183668 DEK SOLENOID VALVE 165431 DEK SINGLE BOARD
Parts & Supplies | Screen Printers
DEK plywood cylinder (158921) Description: DEK plywood cylinder CYLINDER ^ PNEUMATIC ^ COMPACT ^ 12X10 Part NO.: 158921 MORE DEK PARTS IN STOCKS DEK STEPPER MOTOR 140452-181245 DEK SPRING SHAFT KIT 145884 DEK SPRING G0332 DEK SOLVENT PUMP
Technical Library | 2023-01-17 17:27:13.0
Reflow profile has significant impact on solder joint performance because it influences wetting and microstructure of the solder joint. The degree of wetting, the microstructure (in particular the intermetallic layer), and the inherent strength of the solder all factor into the reliability of the solder joint. This paper presents experimental results on the effect of reflow profile on both 63%Sn 37%Pb (SnPb) and 96.5%Sn 3.0%Ag 0.5%Cu (SAC 305) solder joint shear force. Specifically, the effect of the reflow peak temperature and time above solder liquidus temperature are studied. Nine reflow profiles for SAC 305 and nine reflow profiles for SnPb have been developed with three levels of peak temperature (230 o C, 240 o C, and 250 o C for SAC 305; and 195 o C, 205 o C, and 215 o C for SnPb) and three levels of time above solder liquidus temperature (30 sec., 60 sec., and 90 sec.). The shear force data of four different sizes of chip resistors (1206, 0805, 0603, and 0402) are compared across the different profiles. The shear force of the resistors is measured at time 0 (right after assembly). The fracture surfaces have been studied using a scanning electron microscopy (SEM) with energy dispersive spectroscopy (EDS)
Technical Library | 2020-07-08 20:05:59.0
There is a compelling need for functional testing of high-speed input/output signals on circuit boards ranging from 1 gigabit per second (Gbps) to several hundred Gbps. While manufacturing tests such as Automatic Optical Inspection (AOI) and In-Circuit Test (ICT) are useful in identifying catastrophic defects, most high-speed signals require more scrutiny for failure modes that arise due to high-speed conditions, such as jitter. Functional ATE is seldom fast enough to measure high-speed signals and interpret results automatically. Additionally, to measure these adverse effects it is necessary to have the tester connections very close to the unit under test (UUT) as lead wires connecting the instruments can distort the signal. The solution we describe here involves the use of a field programmable gate array (FPGA) to implement the test instrument called a synthetic instrument (SI). SIs can be designed using VHDL or Verilog descriptions and "synthesized" into an FPGA. A variety of general-purpose instruments, such as signal generators, voltmeters, waveform analyzers can thus be synthesized, but the FPGA approach need not be limited to instruments with traditional instrument equivalents. Rather, more complex and peculiar test functions that pertain to high-speed I/O applications, such as bit error rate tests, SerDes tests, even USB 3.0 (running at 5 Gbps) protocol tests can be programmed and synthesized within an FPGA. By using specific-purpose test mechanisms for high-speed I/O the test engineer can reduce test development time. The synthetic instruments as well as the tests themselves can find applications in several UUTs. In some cases, the same test can be reused without any alteration. For example, a USB 3.0 bus is ubiquitous, and a test aimed at fault detection and diagnoses can be used as part of the test of any UUT that uses this bus. Additionally, parts of the test set may be reused for testing another high-speed I/O. It is reasonable to utilize some of the test routines used in a USB 3.0 test, in the development of a USB 3.1 (running at 10 Gbps), even if the latter has substantial differences in protocol. Many of the SI developed for one protocol can be reused as is, while other SIs may need to undergo modifications before reuse. The modifications will likely take less time and effort than starting from scratch. This paper illustrates an example of high-speed I/O testing, generalizes failure modes that are likely to occur in high-speed I/O, and offers a strategy for testing them with SIs within FPGAs. This strategy offers several advantages besides reusability, including tester proximity to the UUT, test modularization, standardization approaching an ATE-agnostic test development process, overcoming physical limitations of general-purpose test instruments, and utilization of specific-purpose test instruments. Additionally, test instrument obsolescence can be overcome by upgrading to ever-faster and larger FPGAs without losing any previously developed design effort. With SIs and tests scalable and upward compatible, the test engineer need not start test development for high-speed I/O from scratch, which will substantially reduce time and effort.
PCB Depaneling Router ML-CS818 This device is suitable for various small multi-connected PCB sub-boards such as mobile phones, tablet computers, automotive electronics, GPS, boards, etc. The enlarged size is suitable for the sub-board processing of
PCB DEPANELING MACHINE ML-CS817/ML-CS818/ML-CS818A/ML-CS818L PCB Depaneling Router ML-CS818 This device is suitable for various small multi-connected PCB sub-boards such as mobile phones, tablet computers, automotive electronics, GPS, boards, etc
SMTnet Express, May 20, 2021, Subscribers: 27,111, Companies: 11,359, Users: 26,657 Rapid Deployment of Automated Test-System for High-Volume Automotive USB-C Hub Adoption and integration of USB-C chargers and hubs in automotive
SMTnet Express, May 5, 2022, Subscribers: 25,613, Companies: 11,567, Users: 27,202 Electronics Manufacturing Technical Articles Rapid Deployment of Automated Test-System for High-Volume Automotive USB-C Hub Adoption and integration
GPD Global | https://www.gpd-global.com/pdf/doc/FLOware-Software-Guide-Addendum-USB-Backup-Utilities.pdf
. Differences between Backup Utilities USB Backup Utilities Functions Utilities for routine backups and disaster recovery include: • backing up system • capturing diagnostics
Whizz Systems | https://www.whizzsystems.com/usb-software/
USB Software - Whizz Systems Skip to content USB Software Services + ENGINEERING SERVICES + FPGA DESIGN SERVICES FPGA DESIGN FEATURES FPGA DEVELOPMENT
.gif)
