Electronics Forum | Mon Aug 27 08:58:24 EDT 2012 | rway
Reese, > > We would agree about the value of an > ICT system, in a general manufacturing > environment. However, a couple of notes > apply: > > 1. ICT isn't a catch-all, either, and > should be used to verify the process, not > validate it.
Electronics Forum | Sat Feb 01 04:49:59 EST 2003 | testing
Hi, We currently have several AOIs on our production/test line which I feel as an engineer, are not being used to their true potential. Does anyone have any ideas on how I can improve their use i.e SPC, Placement in the production line etc since we
Electronics Forum | Sat Jan 25 17:46:07 EST 2003 | testing
I am currently finding it challenging(help!) to determine how I can introduce SPC ontrol within the AOI process and how the AOI can help control other SMT processes. Can someone please provide me with some ideas or any of excels fancy charts/macro
Electronics Forum | Thu Mar 06 03:46:35 EST 2003 | testing
Thanks for the reply Mike, I will look forward to see the end result of your investigation (e-mail people_1@fsmail.net). Regarding the test machines, I was trying to ask what are the suited/or recommended from your experience, set of test equipment
Electronics Forum | Wed Mar 05 03:43:58 EST 2003 | testing
Hi, Mike Thanks for the reply With your oracle system were you able to perfom SPC analysis? and if possible do you have any Material that may be helpful for me to get my system setup i.e. whether through Excel, Access, Oracle etc. + What are your
Electronics Forum | Wed May 28 17:45:03 EDT 2003 | testing
Hi All, I have currently got several AOI Machines that I want to collect data from for some SPC analysis. However, can someone please guide me to what I can and should measure with this equipment such as Cpk etc, and if possible provide some method
Electronics Forum | Thu May 29 14:03:54 EDT 2003 | testing
Hi swagner, I am collecting from both Post and pre reflow applications. Any help would be much appreciated, thanks again. Regards Phil (QA)
Electronics Forum | Mon Mar 03 12:14:33 EST 2003 | testing
I am trying to optimise the use of our Automatic Optical Inspection Machines. As the data we collect from the machine is mainly of the attribute type (Pass/fail, Defect1, Defect2, etc), what advice can you provide to improve its use as well as using
Electronics Forum | Fri Aug 08 11:37:09 EDT 2008 | pjc
Yes, sure. In fact in some applications ICT is coming back. Mainly due to the fact that more and more SMT discrete components have no markings, so AOI cannot tell you if you have the correct value on the PCB. Fixed pin or flying probe ICT is a valuab
Electronics Forum | Wed Dec 13 14:17:26 EST 2017 | emeto
For the ovens you run the profiler and you compare graphs. For the AOI you should run these golden boards(boards that you keep for AOI test - might have intentionally implemented defects) once in a while and make sure you are getting the same results
