Electronics Forum | Mon Mar 03 12:14:33 EST 2003 | testing
I am trying to optimise the use of our Automatic Optical Inspection Machines. As the data we collect from the machine is mainly of the attribute type (Pass/fail, Defect1, Defect2, etc), what advice can you provide to improve its use as well as using
Electronics Forum | Wed Mar 05 03:43:58 EST 2003 | testing
Hi, Mike Thanks for the reply With your oracle system were you able to perfom SPC analysis? and if possible do you have any Material that may be helpful for me to get my system setup i.e. whether through Excel, Access, Oracle etc. + What are your
Electronics Forum | Thu Mar 06 03:46:35 EST 2003 | testing
Thanks for the reply Mike, I will look forward to see the end result of your investigation (e-mail people_1@fsmail.net). Regarding the test machines, I was trying to ask what are the suited/or recommended from your experience, set of test equipment
Electronics Forum | Sat Jan 19 23:23:45 EST 2008 | bentigano
I'm not familiar with SPC Plus. I'll assume it's a "statical process control" system. We use the SPC data collected by our YesTech AOI system, together with a custom, web-based reporting system for process analysis and defect reporting. I am actually
Electronics Forum | Thu Mar 06 11:37:17 EST 2003 | msivigny
Hello Phil, sorry for the confusion, because of our level of defect control and tracking at each process step, we did not use AOI systems at the time. We had a manual inspection station after reflow, then ICT and Functional/Final test for each produc
Electronics Forum | Tue Mar 04 16:02:53 EST 2003 | Dave C.
We have auto-correct funtion on our Panasonic Create CM-301 placement machines but have never turned it on because of a perceived loss of placement time when the camera verifies placement. We look at the first article and correct placemnt if needed.
Electronics Forum | Wed Mar 05 12:23:31 EST 2003 | msivigny
Hello Phil, We did use an Oracle relational database with an Access front end to input and query data from the system for reports. We did not perform SPC with the Oracle dB. As the whole data collection process was completely customized, we hadn't im
Electronics Forum | Sat Mar 12 08:28:01 EST 2005 | Marcus
Fixing your problems needs to be based on hard data. But hard data is difficult to get from humans. They intend to see (and repair) what they e.g. understood best or what is easy to justify. This effect can be eliminated with an AOI. If programmed ri
Electronics Forum | Wed May 28 17:45:03 EDT 2003 | testing
Hi All, I have currently got several AOI Machines that I want to collect data from for some SPC analysis. However, can someone please guide me to what I can and should measure with this equipment such as Cpk etc, and if possible provide some method
Electronics Forum | Mon Mar 03 13:18:02 EST 2003 | msivigny
Hello phil, The use of AOI systems give us the opportunity to auto-collect defect information much the way you're using them now. AOI systems become extremely effective when the collected data is used to perform some positive change into the process.
