Industry News: tried (Page 12 of 46)

New Advanced Test and Inspection at NEPCON Japan 2024

Industry News | 2023-12-25 14:55:10.0

Test Research, Inc. (TRI) will join NEPCON Japan 2024, held at Tokyo Big Sight from January 24 – 26, 2024, to showcase state-of-the-art Test and Inspection Solutions for the Smart Factory. Visit booth #E17-16 to experience the latest test and inspection innovations for the electronics manufacturing industry.

TRI - Test Research, Inc. USA

Lacon Electronic GmbH acquires TRI's AOI Solution for Zero Tolerance

Industry News | 2018-07-12 05:41:35.0

Lacon Electronic GmbH, the German leading electronics manufacturing services for mechatronic, has acquired TRI's AOI TR7500QE. Test Research, Inc. (TRI), the world-class test and inspection systems provider for the electronics manufacturing industry, is pleased to contribute for a higher quality production and honored to announce becoming part of the Approved Vendor List (AVL) for Lacon Electronic GmbH.

TRI - Test Research, Inc. USA

Experience the Future at TRI's Innovation Seminars

Industry News | 2024-01-29 11:16:46.0

Test Research, Inc. (TRI) will feature Innovative Inspection Solutions, SPI, AOI, AXI, and ICT solutions at a series of technology seminars and product demos held in Taiwan, Shenzhen, and Suzhou. Each of the one-day events will focus on the latest test and inspection technology innovations for SMT and Advanced Packaging production, including the Smart Factory and AI-powered Solutions.

TRI - Test Research, Inc. USA

Test Research, Inc. to Highlight Latest Smart Factory Inspection Solutions at NEPCON Japan 2019

Industry News | 2019-01-06 21:32:31.0

Test Research, Inc. (TRI), the leading test and inspection systems provider for the electronics manufacturing industry will join NEPCON Japan held at Tokyo Big Sight to showcase state-of-the-art Inspection Solution for Smart Factories. Visit booth #E17-4 to experience Smart Factory Inspection Solutions in action.

TRI - Test Research, Inc. USA

TRI releases new ICT Solution: BSI Plus

Industry News | 2020-06-18 14:24:36.0

Test Research, Inc. is proud to present the new In-Circuit Tester (ICT) solution BSI Plus.

TRI - Test Research, Inc. USA

Test Research, Inc. to participate in SMTAI 2019

Industry News | 2019-08-21 22:30:16.0

Test Research, Inc. (TRI) will join the 2019 SMTA International Conference and Exhibition to showcase its integrated Smart Factory Test and Inspection solutions for the PCBA manufacturing industry. Please visit booth #224 to experience TRI's 3D AOI, 3D SPI and AXI solutions in action. We invite you to also help us celebrate our 30th-anniversary as the test and inspection solutions leader for the electronics manufacturing industry.

TRI - Test Research, Inc. USA

TRI introduces new AOI - TR7700 SIII Ultra

Industry News | 2023-08-29 07:00:13.0

Test Research, Inc. (TRI) proudly introduces the new AOI TR7700 SIII Ultra.

TRI - Test Research, Inc. USA

TRI won two EM Asia Innovation Awards for AOI and ICT

Industry News | 2020-07-09 18:35:55.0

Test Research, Inc. (TRI) announces that it was awarded two 2020 EM Asia Innovation Awards in two categories. The TR7700Q SII won the Test Equipment: AOI award. The TR5001 SII LED Series ICT was awarded Outstanding Product of the Year. The award ceremony was held during the 2020 Productronica China exhibition in Shanghai, China.

TRI - Test Research, Inc. USA

TRI to showcase AI-powered Inspection Solutions at NEPCON China 2021

Industry News | 2021-03-30 11:50:25.0

Test Research, Inc. (TRI) will join NEPCON China held at Shanghai World Expo Exhibition & Convention Center from April21 – 23, 2021to feature Innovative SMT Inspection solutions for the Smart Factories. Visit booth #1J40to experience Smart Factory Inspection Solutions in action.

TRI - Test Research, Inc. USA

Prime EMS once again selects TRI's Smart Inspection Solutions

Industry News | 2021-06-10 03:45:52.0

Prime Technological Services, LLC once again selects a Test Research, Inc.'s Automated Optical Inspection Solutions.

TRI - Test Research, Inc. USA


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