Electronics Forum | Fri Apr 11 00:32:17 EDT 2003 | Joe
Hello, Regarding the failures not showing up at ICT. Failed decoupling caps are notoriously difficult to diagnose within ICT. Check with your test engineering folks and ask them how they've coded for these parts. I doubt that they will say those
Electronics Forum | Fri Apr 30 17:09:57 EDT 2004 | davef
You're correct. It IS strange. How do you determine that the part is damaged after reflow? With your ICT? Is it possible that the component is being damaged by an inappropriate command that is programmed into your ICT?
Electronics Forum | Thu Sep 07 11:22:33 EDT 2006 | scombs
We had similar problems with some of our products and found the root cause was our ICT fixture. The damaged balls/pads were always in a certain locations so finding the pattern helped. It also didn't help that the boards were ICT'd 10 + times.
Electronics Forum | Tue Dec 19 23:09:25 EST 2006 | laxminarayana pai
Well, you need to change your solder paste.There are pastes available in the market which are meant for ICT pin testability.
Electronics Forum | Wed Jan 17 05:54:53 EST 2007 | imounen
i would like to know if an ICT can test my communication circuit based over RS485 and over optical communication((DO))optical head for counting circuit.
Electronics Forum | Mon Jan 29 20:23:43 EST 2007 | davef
Yes, many ICT can test your RS485 board. You need: * Test program * Test fixture OR you could buy a RS485 tester.
Electronics Forum | Tue Mar 13 21:28:16 EDT 2007 | davef
Try this: http://www.accutroninc.com/download/ict.pdf We have no relationship, nor receive benefit from the company referenced above.
Electronics Forum | Fri Apr 27 10:38:30 EDT 2007 | pjc
No dome needed. You should check what type probe you have. You can look here and consult with them: http://www.qualmaxamerica.com/qualmax/leeno/semi.asp?string=ICT
Electronics Forum | Thu Sep 20 14:58:17 EDT 2007 | jax
For multiple products, none of which have test points, you might want to think about a Flying Probe. Although not as fast as ICT, it should have higher flexibility.It's also easily modified without large tooling/fixture costs.
Electronics Forum | Sat Sep 22 23:57:53 EDT 2007 | accurex
The selection of Test equipment primarily should be driven by the requirement of fault spectrum you would like to capture. If you are looking at Manufacutring defects MDA/ICT would do the job, if you would like to cover the functional aspect a combin
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