Electronics Forum | Thu May 06 01:37:56 EDT 1999 | Kallol Chakraborty
| I would like to know if someone aleady have problems with Ceramic Capacitors SMD in In-Circuit Test (see below)and how did you solve this problems ? | | PROBLEMS | 1 - Only one kind of capacitor (2n2F), of all capacitors on board, sometimes are o
Electronics Forum | Fri May 07 02:29:16 EDT 1999 | Bob Willis
| | I would like to know if someone aleady have problems with Ceramic Capacitors SMD in In-Circuit Test (see below)and how did you solve this problems ? | | | | PROBLEMS | | 1 - Only one kind of capacitor (2n2F), of all capacitors on board, sometim
Electronics Forum | Tue Jul 28 14:34:47 EDT 1998 | upinder singh
Hello everybody. Remember I posted some questions on the smtnet regarding placing the thru hole connector using paste and reflow(pin in hole). I have able to accomplish the process succcesfully.....but I have a problem. The boards are failing at the
Electronics Forum | Mon Jun 08 10:45:25 EDT 1998 | Henry Hickey
How do I mechanically/visually inspect BGA devices when they are soldered to a PCB for possible solder, or other, defects as a first step before part removal and further analysis? I have had board failures due to poor soldering--I think? I can pres
Electronics Forum | Thu Apr 09 22:50:50 EDT 1998 | Larry
Configuration of our HP 3065 in-circuit tester: HP3065 HL testhead with CL+ controller with 2 hard drives and tape drive 11 Hybrid cards 4 Analog cards 1 GP relay card 2 DUT power supplies (6038A) 1 HP color terminal (2397A) 2 HP terminals (700/92 an
Electronics Forum | Mon Apr 20 10:20:37 EDT 1998 | Joyce Hughes
| | Configuration of our HP 3065 in-circuit tester: | HP3065 HL testhead with CL+ controller with 2 hard drives and tape drive | 11 Hybrid cards | 4 Analog cards | 1 GP relay card | 2 DUT power supplies (6038A) | 1 HP color terminal (2397A) | 2 HP t
Electronics Forum | Mon Jul 07 21:08:17 EDT 2003 | sam
I have an experience about AOI that it is necessary in a complicated PCB. Due to the final circuit design, the concerned PCB were having nets on the boards, that the Open/Short could not be identified by traditional In-Circuit testers. Some long tr
Electronics Forum | Thu Sep 25 18:37:36 EDT 2003 | adlsmt
Grind the point on a pogo pin from an in-circuit test fixture flat and push on a leg of the component till it bends, mark the deflection, then add about 30% to the length that the pin pushed in (maybe more if your using no clean and the residue adds
Electronics Forum | Tue Jan 18 22:24:25 EST 2005 | davef
For comparisons of flying probe versus bed of nails in-circuit test (ICT), look here: * http://evaluationengineering.com/archive/articles/1100ate.htm * http://www.emtonthenet.net/techfeatures/200404april/technicalarticle_Technology_03.htm * http:/
Electronics Forum | Thu Dec 01 21:30:31 EST 2005 | davef
Primary methods used to test assembled circuit boards are: * Automated test equipment [ATE] * Manual bench-top functional test equipment Assembled printed circuit board ATE market segments are: * In-circuit ATE * Functional ATE * Boundary Scan AT
