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TRI Introduces New AOI Solution at NEPCON Asia 2020

Industry News | 2020-07-14 16:26:56.0

Test Research, Inc. (TRI) will join NEPCON Asia held at the Shenzhen Exhibition & Convention Center to feature Innovative SMT Inspection solutions for the Smart Factory. Visit booth #1C65 to experience Smart Factory Inspection Solutions in action.

TRI - Test Research, Inc. USA

High-Speed Line Inspection at the IPC APEX EXPO 2024

Industry News | 2024-02-26 13:56:31.0

Test Research, Inc. (TRI) will join the IPC APEX EXPO 2024 held at Anaheim Convention Center on April 9 – 11, 2024. Visit TRI at booth #3510 to experience TRI's latest test and inspection solutions for the High-Speed Line.

TRI - Test Research, Inc. USA

New High-Throughput AOI and AXI at productronica 2023

Industry News | 2023-09-25 18:09:37.0

Test Research, Inc. (TRI) will join productronica 2023, which will be held at Messe München Center from November 14 – 17, 2023. Visit booth No. A2-139 to experience TRI's newly released test and inspection solutions.

TRI - Test Research, Inc. USA

TRI presents New High-Reliability 3D AOI Solution

Industry News | 2021-01-11 15:33:48.0

Test Research, Inc. (TRI) is pleased to announce the release of the high-reliability TR77000QM SII3D AOI.

TRI - Test Research, Inc. USA

TR518 SII Manufacturing Defects Analyzer (MDA)

TR518 SII Manufacturing Defects Analyzer (MDA)

New Equipment | Test Equipment - Bond Testers

Built around the successful and reliable TR518 series platform, the TR518 SII MDA now provides its excellent performance combined with friendly Windows 7 user interface design and USB interface connection to test PC or notebook. With up to 2560 analo

TRI - Test Research, Inc. USA

TRI brings AI-powered Inspection to IPC APEX EXPO 2022

Industry News | 2021-12-17 16:43:01.0

Test Research, Inc. (TRI) will join IPC APEX EXPO 2022 held at San Diego Convention Center to showcase its Smart Factory inspection and test solutions for the electronics manufacturing industry. Visit TRI at booth #915 on January 25 – January 27, 2022, to discover TRI's latest Smart Factory innovations that aim to optimize the SMT production through AI-powered Inspection, multiple 3D technologies, metrology inspection, real-time SPC trends, and M2M communications.

TRI - Test Research, Inc. USA

TR5001T SII Tiny In-Circuit Tester

TR5001T SII Tiny In-Circuit Tester

New Equipment | Test Equipment - Bond Testers

TR5001T SII TINY is a new generation of TRI's Tiny In-Circuit Tester. Offering up to 640 testing points and extending coverage with Boundary Scan, the TR5001T SII TINY brings an extended ICT feature set in the industry's most compact and affordable s

TRI - Test Research, Inc. USA

Inspection Innovations at SEMICON Taiwan 2022

Industry News | 2022-08-14 14:16:58.0

Test Research, Inc. (TRI) will join SEMICON Taiwan held at Taipei Nangang Exhibition Center, Hall 1 – 4F from September 14 - 16, 2022. Visit booth #M1034 to experience the latest in Smart Factory Semiconductor Inspection.

TRI - Test Research, Inc. USA

TRI Highlights Smart Factory Inspection Solutions at IPC APEX EXPO 2019

Industry News | 2019-01-06 21:27:59.0

[December 14, 2018 – San Jose, CA] Test Research, Inc. (TRI), the leading test and inspection solutions provider for the electronics manufacturing industry will join IPC APEX EXPO 2019 held at San Diego Convention Center to showcase its Smart Factory inspection and test solutions for the printed circuit board electronics manufacturing industry. Visit TRI at booth #2533 on January 29 – January 31, 2019 to discover the newest innovations in 3D SPI, 3D AOI, 3D CT AXI and multicore ICT.

TRI - Test Research, Inc. USA

TR518 SII Manufacturing Defects Analyzer (MDA)

Videos

Built around the successful and reliable TR518 series platform, the TR518 SII MDA now provides its excellent performance combined with friendly Windows 7 user interface design and USB interface connection to test PC or notebook. With up to 2560 analo

TRI - Test Research, Inc. USA


tr 7600x sii searches for Companies, Equipment, Machines, Suppliers & Information

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