Used SMT Equipment: bands and test (Page 5 of 28)

Japan Radio Company OAB-1560

Japan Radio Company OAB-1560

Used SMT Equipment | General Purpose Test & Measurement

JDSU OAB-1560 Optical Erbium-Doped Amplifier JDS Uniphase erbium-doped fiber amplifiers (EDFAs) amplify optical signals across the EDFA window (1528-1610 nm). Through optimization of amplifier gain, noise figure, and saturated output power, the

Test Equipment Connection

Anritsu MW8208A

Anritsu MW8208A

Used SMT Equipment | In-Circuit Testers

Anritsu MW8208A PIM Tester for 1900 MHz bands Anritsu introduces its first generation high performance PIM testing solution for the Cellular, E-GSM, PCS, and AWS, frequency bands. Anritsu has developed the PIM Master to verify if receiver inter

Test Equipment Connection

Exfo LOW LINEWIDTH WDM TUNABLE LASER SOURCE

Exfo LOW LINEWIDTH WDM TUNABLE LASER SOURCE

Used SMT Equipment | General Purpose Test & Measurement

KEY FEATURESLaser on and off in one clickSelection of pre-configured channel or any wavelength in the covered wavelength rangeHigh power:14 dBmIdeal for optical amplifier testing or WDM test bedsLow linewidth:Polarization maintaining output for use w

Shenzhen Megatech

Aeroflex 2935

Aeroflex 2935

Used SMT Equipment | General Purpose Test & Measurement

The IFR / Aeroflex 2935 high speed test head provides all the radio signalling and protocol control required to carry out GSM and GPRS functional testing and radio measurements in accordance with the ETS 300 607-1 specification. It covers the full GS

Test Equipment Connection

Agilent 81640A-071

Agilent 81640A-071

Used SMT Equipment | In-Circuit Testers

Agilent 81640A-071 Tunable Laser Module low SSE 1600 The Agilent 81640A tunable laser source covers both C- and L - Band. It is specially designed for testing critical DWDM passive components. This Agilent "A" Tunable Laser Source has been rep

Test Equipment Connection

Agilent 81640A-071

Agilent 81640A-071

Used SMT Equipment | In-Circuit Testers

Agilent 81640A-071Tunable Laser Module low SSE 1600 The Agilent 81640A tunable laser source covers both C- and L - Band. It is specially designed for testing critical DWDM passive components. This Agilent "A" Tunable Laser Source has been replaced by

Test Equipment Connection

Agilent 81640A-071

Agilent 81640A-071

Used SMT Equipment | In-Circuit Testers

Agilent 81640A-071 Tunable Laser Module low SSE 1600 The Agilent 81640A tunable laser source covers both C- and L - Band. It is specially designed for testing critical DWDM passive components. This Agilent "A" Tunable Laser Source has been rep

Test Equipment Connection

Agilent 81640A-071

Agilent 81640A-071

Used SMT Equipment | In-Circuit Testers

Agilent 81640A-071 Tunable Laser Module low SSE 1600 The Agilent 81640A tunable laser source covers both C- and L - Band. It is specially designed for testing critical DWDM passive components. This Agilent "A" Tunable Laser Source has been rep

Test Equipment Connection

JDSU OAB-1560

JDSU OAB-1560

Used SMT Equipment | In-Circuit Testers

JDSU OAB-1560 Optical Erbium-Doped Amplifier JDS Uniphase erbium-doped fiber amplifiers (EDFAs) amplify optical signals across the EDFA window (1528-1610 nm). Through optimization of amplifier gain, noise figure, and saturated output power, the

Test Equipment Connection

JDSU OAB-1560

JDSU OAB-1560

Used SMT Equipment | In-Circuit Testers

JDSU OAB-1560 Optical Erbium-Doped Amplifier JDS Uniphase erbium-doped fiber amplifiers (EDFAs) amplify optical signals across the EDFA window (1528-1610 nm). Through optimization of amplifier gain, noise figure, and saturated output power, the

Test Equipment Connection


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