Electronics Forum: probe (Page 6 of 39)

No Clean OSP process cause ICT testing issue due to Flux building in testvia hole

Electronics Forum | Fri Mar 29 07:53:12 EDT 2019 | davef

Why are you printing paste on test via? In the old days, we probed soldered pads to cushion impact force of probing. Is that still a reasonable practice?

FPT Flying Probe Tester

Electronics Forum | Thu Aug 13 18:49:06 EDT 2020 | dwaynejones

We have Flying Probe Tester for sale. Like new Demo unit only http://depanelmaster.com/consignment/

Profiling LQFP-144 with ground plane

Electronics Forum | Thu Feb 24 15:14:48 EST 2022 | joshsvoboda

The thermocouples were attached with a square of aluminum tape holding the probe to the part joint. Kapton tape was used to secure the aluminum tape to the board surrounding but not covering the probe. We are using a X5 KIC profiler with the 2G sof

SPEA 4040 Flying Probe tester--How about Takaya Flying Probe Tes

Electronics Forum | Mon Aug 15 10:06:38 EDT 2011 | terrytaaffe

Hi All, > > We are thinking about adding a SPEA > 4040 flying probe tester to our facility to add > some flexability to our test capabilities. Does > anyone have experience they could share on these > units? I would be most interested in progr

Flying Probe Vrs BON ICT

Electronics Forum | Tue Jan 18 22:24:25 EST 2005 | davef

For comparisons of flying probe versus bed of nails in-circuit test (ICT), look here: * http://evaluationengineering.com/archive/articles/1100ate.htm * http://www.emtonthenet.net/techfeatures/200404april/technicalarticle_Technology_03.htm * http:/

Flying Probe

Electronics Forum | Sat Jul 29 13:30:17 EDT 2006 | Chunks

Some have a bottom side adaptor plates with pins to make contact to certain areas of your board. The top side may have one or multiple heads that can move the entire area of your board. On each of these haeds is a pin like that from an ICT machine.

Flux residue cause high false reject at ICT

Electronics Forum | Wed Nov 29 11:56:10 EST 2006 | CK the Flip

For the better part of my career, I've battled with ICT guys on so-called "flux residues" on their test probes, and this was when using NO-CLEAN, 2% to 5% solids tops, flux. People don't understand that ICT probe maintenance is an inherent part of

RoHS - Chromium

Electronics Forum | Fri May 08 02:23:15 EDT 2009 | tang

Hi all, Presently, we have loan a thermometer probe from supplier which used to check Soldering pot temperature. But we found that the probe consisted of High CR6+ (Chromium) with reading about 187000ppm. As I know stanless steel consisted this ch

liquidous (indium 8.9hf)

Electronics Forum | Thu Apr 07 11:39:48 EDT 2011 | remullis

My oven profile is 155,160,165,180,220,245,255,227 Cooling Zone 132/92. This is a 8 zone CV820 Technical Devices oven. My assy profile using Datapaq Q18 - Base on one probe feedback - Positive slope (7.09), Pos Slope Time (.45), Rise Time (1.17), Me

Testing effect of non-clean flux residue on solder joints

Electronics Forum | Fri Nov 03 09:31:35 EDT 2017 | davef

On the flux reside issue that is gumming up your test probe pogos ... Short term, clean what's in process with a aerosol flux cleaner solvent. Ask your flux supplier for recommendations. Longer term, recognizing that there is no fix, your improveme


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