Electronics Forum | Thu May 26 19:32:13 EDT 2005 | Mike Konrad
Three popular methods: Resistivity of Solvent Extract (ROSE) Test Method IPC-TM-650 2.3.25: The ROSE test method is used as a process control tool to detect the presence of bulk ionics. The IPC upper limit is set at 10.0 *g/NaCl/in2. This test is p
Electronics Forum | Mon Mar 17 18:37:59 EDT 2008 | aqueous
We manufacture both bulk and localized ionic contamination testers. My answer is from the perspective of the cleanliness testing method. The issue with all bulk ionic contamination testers (Ionagraph, Omegameter, Zero-Ion), is that they test the en
Electronics Forum | Mon Jul 30 21:03:44 EDT 2001 | davef
You should specify the level of res based on the effect of the res on the end-use of the product. J-STD-001 defines cleanliness requirements for ALL flux types, including water soluble and no-clean that you mention. 1 There is no equivalency betwee
Electronics Forum | Mon Mar 01 22:24:53 EST 1999 | Dave F
| It seems to be that we have to much NaCl left on our assambled PCB's. | The flux we use is from cobar. They say it can not be from the flux... So what can be the reason, what kind of problem may occer when there is to much NaCl. | George: When so
Electronics Forum | Fri Dec 06 12:24:03 EST 2002 | Mike Konrad
Military and most commercial standards requires post-soldered boards to measure less than 10 �g/in of NaCl (14 when using an Omegameter, 20 on a Ionagraph, and 37 on a Zero-Ion). As Dave stated, 6.5 �g/in of NaCl is called out in Mil-P-55110 for ba
Electronics Forum | Mon Jan 08 20:57:52 EST 2001 | Dave F
Are you talking about bare board cleanliness or assembly level cleanliness? Bare board cleanliness is still primarily measured by resistivity of solvent extract (ROSE) using instruments such as Omegameters and Zero Ions. What is considered as "acce
Electronics Forum | Tue Dec 29 22:31:06 EST 1998 | Kelvin Chow
It is still a big concern on using No-clean or aqueous cleaning for CSP assembly. I prefer to use no-clean, however, not all components are suitable to use it. Especially those dirty capacitors or connectors which may cause solderability problem. It
Electronics Forum | Mon Oct 21 22:15:36 EDT 2002 | davef
First, SIR data is heavily dependant on the test pattern selected. Be very careful when comparing the results of resistance readings taken from different geometric patterns. Second, if yer talkin': * Bare boards, yupper. * Finished assemblies impor
