Electronics Forum: stress test (Page 7 of 19)

Low Voltage Device damage on z18xx ICT

Electronics Forum | Wed Nov 26 07:45:24 EST 2008 | davef

Investigation of Device Damage Due to Electrical Testing, R Croughwell & J McNeill, Worcester Polytechnic Institute Abstract: This paper examines the potential failure mechanisms that can damage modern low voltage CMOS devices and their relationship

bad connections, or not?

Electronics Forum | Mon Jan 15 14:25:54 EST 2001 | davef

Let me make several points on this issue � POINT 1: Let�s be basic � Soldering and welding are examples of process that the quality types call "special processes". Special process. The results of special processes cannot be verified fully by subs

Substrate Au/Ni thickness

Electronics Forum | Thu Feb 15 19:41:38 EST 2001 | davef

What do you mean by "But after performing temperature cycle test, the former aging rate (from the shear strength ) seems faster than the latter."? Comments are: I can't recall having heard the term "precipitation hardness" [not that that means anyt

Re: haloing on SMT PCBs

Electronics Forum | Mon Jun 08 15:00:08 EDT 1998 | Earl Moon

| I work QA at an OEM in Alberta, Canada. I saw earlier posts on the smtnet regarding PCB haloing criteria. I am currently in a dispute with my PCB vendor over the acceptability of haloing (delamination) around plated through holes and vias on a lot

Thermal testing

Electronics Forum | Wed Jun 23 13:56:56 EDT 1999 | Stan Frul

Hi Could anyone tell me where i can find information, in the literature or on the Web, concerning measurements of temperature distribution, expansion, stresses in the substrate and heat sink and on the interface between them, that is all the range of

PCB Trouble shooting Lab

Electronics Forum | Tue Apr 17 09:38:04 EDT 2001 | CAL

With some help from our good Friends at Agilent Technologies our RF Lab includes testing up to 100GHz. Equipment includes Vector network analyzer, signal analyzer, dual channel power meter, noise filter meter, advanced impedance analyzer (including

LED lifted soldering defect

Electronics Forum | Thu Dec 05 05:39:05 EST 2019 | oxygensmd

I know your application isn't BGA but the data sheet also mention about the peak temperature - 235 Celsius. For the LEDs you can reach higher temperature and I recommend to reach 225-235 Celsius. You will get significantly better results because the

Re: Test the solder point

Electronics Forum | Thu Nov 18 10:56:16 EST 1999 | Dave F

Jacky: There�re major four factors that affect the reliability of a solder connection. 1 Design of the connection including the shape and height of the lead and the type and amount of solder. 2 Dissolution of base metals into the solder connection.

Measuring PCB Stress during the assembly process

Electronics Forum | Tue Nov 27 20:32:38 EST 2001 | davef

Stress is meaningful if it affects the long term reliability in a product's end-use environment. I don�t believe that things are that straight forward, although it would be nice if they were. Consider that differences in materials, number of layers

Re: Qualifying new PWB Vendors

Electronics Forum | Fri Jan 15 15:17:21 EST 1999 | Earl Moon

| | Hello, | | | | We are qualifying new sources of PWB vendors. We've got the first lot of "produciton" boards in and we want to put them through the paces before turing the vendors on. | | | | So far, the tests I can think of performing, and tha


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