Electronics Forum: ict probe pm (Page 9 of 12)

Re: Pin in hole process problem

Electronics Forum | Tue Jul 28 16:13:45 EDT 1998 | Steve Gregory

| Hello everybody. | Remember I posted some questions on the smtnet regarding placing the thru hole connector using paste and reflow(pin in hole). I have able to accomplish the process succcesfully.....but I have a problem. The boards are failing at

Probing Vias

Electronics Forum | Wed Jul 20 15:05:28 EDT 2005 | Fred M.

With the new rev D release of IPC-A_610 came a new section 10.2.9.3 which identifies a via (through hole) with nicks along the inside of the annular ring. Defect is all three classes and states "Damage to conductor or lands". We have for years defa

No Clean OSP process cause ICT testing issue due to Flux building in testvia hole

Electronics Forum | Thu Apr 04 09:45:58 EDT 2019 | davef

That's what I guessed. Some ideas to consider are: Reduce usage of flux to the bare minimum. Choose a low solids flux Flux residues can be categorized as soft, brittle, sticky but this depends mostly on the formulation of the flux and the resins

Flying Probe Testers?

Electronics Forum | Mon Aug 17 10:23:35 EDT 1998 | Steve Gregory

Good Day All!! I hope ya'll had a decent weekend, I did...didn't do a damn thing, I like weekends like that. Anyways, the big guys here are thinking about buying a "Flying Probe" tester, and the G.M. came to me and asked what I thought of them. I ha

Re: Flying Probe Testers?

Electronics Forum | Thu Aug 20 09:30:27 EDT 1998 | JUSTIN MEDERNACH

| Good Day All!! | I hope ya'll had a decent weekend, I did...didn't do a damn thing, I like weekends like that. Anyways, the big guys here are thinking about buying a "Flying Probe" tester, and the G.M. came to me and asked what I thought of them.

Re: Flying Probe Testers?

Electronics Forum | Thu Aug 20 09:36:45 EDT 1998 | Dave F

| | Good Day All!! | | I hope ya'll had a decent weekend, I did...didn't do a damn thing, I like weekends like that. Anyways, the big guys here are thinking about buying a "Flying Probe" tester, and the G.M. came to me and asked what I thought of the

Re: Flying Probe Testers?

Electronics Forum | Tue Aug 18 02:28:42 EDT 1998 | Bob Willis

| Good Day All!! | I hope ya'll had a decent weekend, I did...didn't do a damn thing, I like weekends like that. Anyways, the big guys here are thinking about buying a "Flying Probe" tester, and the G.M. came to me and asked what I thought of them.

Converting to 'No-Clean' process

Electronics Forum | Fri Apr 14 13:30:20 EDT 2000 | Murad Kurwa

Hi All: Can you tell me specifically if you converted an exiting product made with Clean process using WS609 or compatible to 'No-Clean' process. We have to convert assemblies from current clean process at a CEM to No-Clean process in our own factor

piercing of test vias at ICT

Electronics Forum | Fri Nov 15 15:02:37 EST 2002 | MA/NY DDave

OK I know it is funny to have two different PWB/PCB processes, one for pre production and one post production yet it is possible if controlled and implemented in a strategy. In debug if your company's experience has been for a repeated need to do IC

SMT INSPECTION SYSTEM

Electronics Forum | Fri Mar 16 06:54:40 EDT 2007 | bbl

My company is also looking at AOI. There is one group that is promoting flying probe ICT as well. We can only afford to purchase one or the other this year. Does anyone have data that compares advantages/disadvantages of each? I see them as comp


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