Webinar: How to Improve Defect Identification from an X-ray Inspection System
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Tue, June 15, 2021 |
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Presenter: David Bernard, Ph.D., David Bernard Consultancy Tuesday, June 15, 2021 @ 12:00pm (US Eastern) Free for SMTA Members! Having troubles receiving the discount price? Contact webinars@smta.org
Overview: There are many X-ray inspection systems, both old and new, that are used today for the defect identification of electronic components and assemblies. However, the imaging capabilities these systems have can vary widely. Therefore, understanding the potential limitations in a specific X-ray system ensures that it can be successfully used for appropriate investigations, it is not utilized for applications it cannot see and can do this without compromising the analytical effectiveness. About the Presenter: Dr. David Bernard is an X-ray Consultant for the Electronics Industry. He has more than 20 years of experience in the use and understanding of X-ray inspection and test for the electronics industry. He is the original author of the book ‘a practical guide to X-ray inspection criteria and common defect analysis’. Dr. Bernard attained a D.Phil. in Chemical Physics from the University of Sussex in the UK |
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