Monitoring & Bench marking Your Processes and Assembly Yields

Monday, 10 August @ 2:30pm - 4:00pm GMT (9:30am - 11:00am US Eastern Time)

Presenter: Bob Willis, SMTA Europe

Overview

There are no easy methods for companies to compare their manufacturing yields with other similar businesses. A common question asked by many company managers is "How does my process compare with other companies in terms of yield"? The information does not exist or is not easily available to small and medium volume companies

The most commonly used method of illustrating yield is Part Per Million (PPM) Defective. This provides a measure of the defect level against a process stage or a specific product compared against a known number of opportunities for defects to occur. There are IPC and IEC documents and procedures which do exist to monitor a process. This webinar will show how to implement a defect monitoring project in your company and the yield data produced. Bob Willis ran the SMART Group PPM Monitoring project supported by DTI and helped implement the LEADOUT project. these were the first project or their type in the world

Topics included in our webinar:

• Why monitor your process for yield?
• PPM, DPM or DPU
• Collecting Inspection Data
• Screen Printing
• Inspection Criteria
• Common Defects
• Component Placement
• IPC Inspection Criteria
• Reflow Soldering
• IPC Inspection Criteria
• Wave Soldering
• Collaborative Data Collection
• Assembly Types
• Comparing company yields

After the webinar there is a Q&A session which provides ample time for all delegate questions to be answered. However, if a delegate has a process example they would like covered in the webinar, it will need to be provided in advance of the session. The webinar will run for between 60-90min with question and answer session. The webinars are limited to 100 delegates/companies. A copy of each of the slides presented will be provided after the webinar. All webinar times shown are UK time – to check your local time in your countries click here