Webinar: How to Improve Defect Identification from an X-ray Inspection System

Presenter: David Bernard, Ph.D., David Bernard Consultancy 

Tuesday, June 15, 2021 @ 12:00pm (US Eastern)

Free for SMTA Members! 

Having troubles receiving the discount price? Contact webinars@smta.org

 

Overview:

There are many X-ray inspection systems, both old and new, that are used today for the defect identification of electronic components and assemblies. However, the imaging capabilities these systems have can vary widely. Therefore, understanding the potential limitations in a specific X-ray system ensures that it can be successfully used for appropriate investigations, it is not utilized for applications it cannot see and can do this without compromising the analytical effectiveness.
This presentation will identify, and explain, the operational parameters of an X-ray inspection system that affect the image quality, the available magnification and image views they can achieve. From this, practical methods will be suggested to help improve the defect identification of commonly X-ray inspected components such as BGAs and QFNs.

About the Presenter:

Dr. David Bernard is an X-ray Consultant for the Electronics Industry. He has more than 20 years of experience in the use and understanding of X-ray inspection and test for the electronics industry. He is the original author of the book ‘a practical guide 

to X-ray inspection criteria and common defect analysis’. Dr. Bernard attained a D.Phil. in Chemical Physics from the University of Sussex in the UK
.