VERTEX II Next Generation Affordable X-ray Inspection
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VERTEX II Next Generation Affordable X-ray Inspection |
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VERTEX II Next Generation Affordable X-ray Inspection Description:
VJ Electronix leads the way in providing robust and practical X-ray solutions to solve real production issues. Innovation and simplicity govern system design to maximize ease-of-use with programmed inspection and a simple 1–2–Go! user interface.
Vertex II X-ray systems are production ready, offering superior uptime and unmatched value. The Vertex Series is configurable to match a variety of applications with off-axis imaging and a variety of available X-ray sources, detectors and product manipulators.
Vertex II Offers a simple approach to automated inspection. Programmed sequences and automated reports provide valuable data for process control, at a fraction of the cost of most automated systems.
Vertex II is configurable with several microfocus X-ray Tubes for high resolution applications such as electronics assemblies, semiconductor packaging, automotive batteries, sensors, and counterfeit detection. VJ Electronix also offers high power millimeter focus X-ray sources for castings, munitions, automotive assemblies, and other NDT inspections.
The Vertex is equipped with innovative Nexus 300 Inspection Software and Analysis Tools providing Manual Operation or fully Automated Inspection routines. Nexus 300 image processing offers: Advanced Defect Enhancement, Pseudo Color, Edge Detection, BGA Area, Circularity, Voiding, Large Area Analysis, Void Ratio and Feature Masking. Automatic report generation and a real time event log provide product traceability.
The Vertex Series-A is an ergonomic, flexible and reliable X-ray Platform which can be easily adapted to almost any inspection task. The 75kV configuration can be upgraded to 130kV as required. As an Audit system, Vertex is suited for production environments to perform sample testing of volume production.
Standard Features
- Wide variety of X-ray sources and detectors
- Large sample capacity
- Manual and programmable operation
- Image Processing – Archival (multiple formats), annotations, and measurement tools
- BGA analysis
- Area void analysis
Optional Features
- High Resolution, High Contrast CMOS Digital Flat Panel Detectors
- Up to 45 Degrees of Off Axis (Oblique) Viewing Without Tilting the Sample or Changing Magnification
- Nexus 300 Inspection Software and Analysis Tools
- Advanced Defect Enhancement
- Feature Masking for Double Sided Boards
Common Configurations:
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Model |
V75 |
V90 |
V130 |
V160 |
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X-ray Source |
75kV |
90kV |
130kV |
160kV |
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Spot Size |
45μ |
4μ |
5μ |
0.5 mm |
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Spatial Resolution |
>20lp/mm |
>40lp/mm |
>40lp/mm |
200 – 400 μ |
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Total Magnification |
435X |
3600X |
1950X |
1X – 20X |
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Maximum Field of View |
>2” (50 mm) |
>1.6” (40 mm) |
>2” (50 mm) |
8 – 16 inches (200–400mm) |
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Optional Off Axis |
+/- 45⁰ |
+/- 45⁰ |
+/- 45⁰ |
Application Dependent |
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Sample Size & Scan Area |
19.4 x 20.7” (490 x 525 mm) 17.4" x 20.4" (440 x 518 mm) - with ergonomic pull out drawer option |
VERTEX II Next Generation Affordable X-ray Inspection was added in Apr 2014
VERTEX II Next Generation Affordable X-ray Inspection has been viewed 1024 times
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