CHM - Crimp Height Measurement Device

CHM - Crimp Height Measurement Device Description:

Overview

The CHM device simplifies the crimp height measurement process resulting in faster measurement time and improved consistency.

• Pin & blade measuring points
• Easier terminal positioning
• Consistent measuring force
• Improved reliability and repeatability

Processing Capabilities

• Conductor or insulation crimp height measurement
• Standard, non-insulated crimp contacts (B-crimp)

Application Range

The CHM device is most commonly used for crimp height measurement on standard, non-insulated, crimp terminals. Most commonly used for B-style crimps but others may be possible.

Concept

The Schleuniger CHM crimp height measurement system distinguishes itself from conventional hand-held units by its ease of measuring. The measurement process is much less cumbersome than hand-held units, thereby significantly reducing the time required to take the measurement. The operator can use both hands to hold the terminal in position in the lighted work area. This ensures that the terminal is
positioned properly in the micrometer. The spring-loaded measuring pin ensures consistent pressure on the terminal, significantly improving consistency between operators.

Function

The standard measuring contacts on the CHM are the pointand- nblade combination designed specifically for measuring crimp height. The lever on the side raises the top pin allowing the operator to insert the sample. When the operator lowers the lever, the spring-loaded pin drops to make contact with the sample. The operator is then free to adjust the sample as needed for the most accurate measurement. By using the CHM, your crimp height testing process will become more efficient, reducing the amount of time required for collecting test data. Furthermore, the spring-loaded pin encourages measurement results to be more consistent between operators.

Special Features

• Pin & Blade measuring points
• Easier terminal positioning
• Consistent measuring force
• Improved reliability and repeatability