Hioki: FA1240 Flying Probe Tester
Hioki: FA1240 Flying Probe Tester Description:
Ultra-High speed measuring
Measuring rate up to 40 steps per second helps reduce tact times and can actually be used in fully automated production lines averting a bottleneck. This is indeed a unique strength of Hioki’s flying probe testers.
Fine pitch inspection
Accurately and consistently test down to a lead pitch of 0.2 mm. This allows inspection of fine-pitch components that fixture based testers cannot execute reliably.
Supplementary vision inspection
Supplement overall inspection strategy with Hioki’s standard vision function allowing for component presence/absence check, as well as polarity and displacement confirmation.
A completely revamped Windows 7 based user interface makes use of graphics-rich environment making productivity very intuitive and efficient. Competent and reliable testing achieved regardless of operator.
Wide inspection area
Wide range of board sizes can be inspected from 2" x 2" to 20" x 18".
Automatic position compensation function
Standard feature working in conjunction with high-precision mechanism that enables probing with extremely high accuracy. Debug process is simple and precise with use of a CCD camera for teaching data coordinates and creating offsets.
A wealth of options
A range of options and accessories available. An optimum system can easily be constructed to cater to customer needs.
- CAD conversion software (Siemens Test Expert)
- Gerber data creation system (Hioki’s alternative to CAD based method, ideal for EMS companies and CMs.)
- Manual teaching using CCD camera.
Loading system is standard SPEC
The board loading function is part of the standard package that makes it simple to establish an automatic inspection system. Interface for HIOKI standard equipment is also provided as standard setup including SMEMA compatibility.
High probing accuracy
Probing accuracy of ±100 µm and movement repeatability accuracy of ±50 µm, ideal for testing fine pitch assemblies for both shorts and open circuits.
Test order optimization
To minimize mechanical travel distance of the probes, the test order sequence is automatically optimized to increase efficiency and ultimately reduce cycle times.
Bad mark detection
The equipped CCD camera can be used for detection of inspection marks used for multiple-sample boards as well as inspection only involving the step of image detection of marks.
Coordinate data teaching
The standard equipped camera can be used for simple and accurate coordinate data input and data revision for debugging.
Hioki: FA1240 Flying Probe Tester was added in Feb 2018
Hioki: FA1240 Flying Probe Tester has been viewed 795 times