TR7700QM SII - Metrology-grade Inspection

Company Information:

Test Research is the World's leading supplier of Test and Inspection Solutions in the PCBA Manufacturing Test & Inspection Industry. From 3D SPI, 3D AOI and 3D AXI Systems to MDA, ICT and Functional Test. Industry 4.0 Ready.

San Jose, California, USA

Manufacturer

408-567-9898
408-567-9288

See Supplier Website »

Company Postings:

(31) products in the catalog

(47) news releases

Name:	TR7700QM SII - Metrology-grade Inspection
Category:	Inspection
Offered by:	TRI - Test Research, Inc. USA

TR7700QM SII - Metrology-grade Inspection Description:

The TR7700QM SII is built on a high accuracy platform with 5.5 µm high resolution 12 MP imaging technology for the Semiconductor & Packaging industry. The Stop-and-Go 3D AOI can inspect wire bonds, die bonds, SMD, bumps, and solder joints. The Smart 3D AOI solution's accuracy is enhanced with metrology capabilities and flexible inspection algorithms.

Features:

Semiconductor and Packaging technology Inspection.
5.5 μm Resolution for Ultra-High Precision Metrology-grade Inspection
Ready to Inspect in Minutes with TRI's Smart Programming
Multiple 3D Technologies for Full coverage Inspection

TR7700QM SII - Metrology-grade Inspection was added in Jul 2022

TR7700QM SII - Metrology-grade Inspection has been viewed 128 times