In-line Automated Test System - MTS 300 IL and MTS 30
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In-line Automated Test System - MTS 300 IL and MTS 30 |
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In-line Automated Test System - MTS 300 IL and MTS 30 Description:
Non-multiplexed In-Circuit Test, Functional Test, Boundary Scan and Flash Programming Capability.
HIGHEST THROUGHPUT AND HIGHEST QUALITY TEST
- Full In-Line Integration
- Compatible with Lambda Parallel Testing Solutions. Non-Multiplexed to 3,456 pins
- Fast Test Program Generation
- Safe Back-Driving
- 10V and Low Voltage Driver/Sensor Options
- Links to CAD through C-LINK
The MTS300 and MTS 30 from Digitaltest is designed to meet the demands of today’s In-Line Manufacturing Rewuirements: flexibility, high fault coverage and ease of programming.
The flexibility of the test system is guaranteed by the modular design and the variety of test methods it offers.
The system is designed for high throughput; with up to 1,000 analog measurements per second it is one of the fastest test systems available on the market.
Sigma test systems provide analog and digital In-Circuit Test capabilities, Vectorless Testing, Functional Test, Boundary Scan and On-Board Programming.
The non-multiplexed pin architecture provides the opportunity to adapt to existing fixtures and test programs currently used with other test systems and enable testing on the MTS300.
In-line Automated Test System - MTS 300 IL and MTS 30 was added in Apr 2013
In-line Automated Test System - MTS 300 IL and MTS 30 has been viewed 635 times
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