INGUN Pruefmittelbau GmbH

We are a globally operating company for Testing Equipment Manufacturing and offer am unsurpassed choice of Test Probes and Test Fixtures.

OEM

We have been developing, manufacturing and selling Testing Equipment for various fields since 1971. We are a globally operating company for Testing Equipment Manufacturing and offer am unsurpassed choice of Test Probes and Test Fixtures.

We offer the most comprehensive assortment of testing equipment, i.e. Spring-loaded Test Probes, Cable Harness Test Probes, RF-Probes and Test Fixtures.

Our strength lies especially in customized solutions. Thanks to our long-standing experience in designing and manufacturing test equipment we have the right answer to every testing demand.

INGUN Pruefmittelbau GmbH Postings

2 technical articles »

Test Fixture Design Presentation ICT & FCT Test Fixtures

May 20, 2021 | Greg Dorsey & Sven F. Nocher

Quality Control is essential in production processes. In the PCB Assembly process there are several Quality Control steps or options. The most popular tests are the electrical (In-Circuit or ICT) and the function (functional or FCT/FVT) test. ICT test fixtures are standardized and there are several major test platforms available which are industry standards. For FCT applications there are many more variations possible due to the vast number of testers and interface approaches unique to each customer; also due to an endless list of applications which fall under the category of Functional Test (RF, High Current, LED test, Leak test etc.) Test Probes are a very important part in ICT as well as in FCT applications. If the wrong test probe (type, spring force, tip style etc.) is used, the test fixture will not work as intended. In addition the test probe must be installed correctly in order to work properly. This presentation will show general information and some guidelines for a proper Test Fixture design to assure the most efficient production....

Novel Probing Concepts for Mass-Production Tests: Design and Challenges

Jun 15, 2012 | Matthias Zapatka, Dipl.-Ing.(FH) ; Otmar Fischer, Dipl.-Ing. (FH) ; Sven Nocher

First published in the 2012 IPC APEX EXPO technical conference proceedings. The world of spring-loaded test probes and special probes for in-circuit and functional tests have grown tremendously over the past few years. Ever increasing demands for electro ...

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