In Circuit Test (ICT) Testing Development
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In Circuit Test (ICT) Testing Development |
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In Circuit Test (ICT) Testing Development Description:
Intrinsic Quality’s engineers stand at the forefront of ICT (In Circuit Test) development, and are ready to optimize your programming and fixture design for solutions from GenRad – Teradyne. Our engineers design exceptional streamlined test development and then debug with an innovative approach that will fit your testing requirements.
Our ICT Board Test Features:
- Flash Programming
- Boundary Scan (JTAG)
- Opens Xpress (Frame Scan)
- Design for Test Analysis
Intrinsic Quality supports a variety of architectures including: GR228X, GR227X, TS12X, TestStation, LH, LX, TestStation Duo, and TestStation TSR.
In Circuit Test (ICT) Testing Development was added in Aug 2015
In Circuit Test (ICT) Testing Development has been viewed 1399 times
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