XCT-1000 CT/X-RAY System
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XCT-1000 CT/X-RAY System |
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XCT-1000 CT/X-RAY System Description:
Manual and semi-automatic μCT inspection systems for small electronic components with measurements of voxel sizes around 15 – 20 μm.
The XCT-1000 series systems meet the most stringent demands in CT X-ray. With this Computed Tomography system, MatriX Technologies offers the highest possible flexibility for individual customer requirements. This space-saving system can be equipped with different X-ray powers, from 130 kV to 150 kV with nano/micrometer resolution. It is especially suitable for the inspection of small to medium production volumes or for the use in laboratory environment.
The XCT-1000 system is capable of processing the Siemens CERA-TXR technique with exact Volume reconstruction by using the latest CMP-technology for automatic geometrical correction and calibration. This fast, real-time CT reconstruction technique provides cone artifact free images with automatic volume slice separation and automatic analyzing functionalities.
The flexible manipulator system allows different and optimized magnification-setups depend on sample sizes and geometry.
The XCT-1000 system is ideal for non-destructive testing, materials investigations and, in particular, dimensional measurements for internal structures, undercuts and free form surfaces.
System features
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Inspection system with manual and automatic defect detection and defect verification capability
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Horizontal X-ray beam and vertical rotation axis to avoid gravitation influences
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160 kV X-Ray Tube; Optional: 225kV and 320kV
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Multi-axes motion system with sample rotation table
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Universal detector mounting for various digital flat panel types
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MIPS inspection platform for off-line programming, analyzing and defect verification
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High performance, state of the art software for reconstruction, data analysis and 3D visualization
Applications
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Sophisticated CT inspection of electronic parts
XCT-1000 CT/X-RAY System was added in Jan 2016
XCT-1000 CT/X-RAY System has been viewed 916 times
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